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Broadband Dielectric Material Characterization: A Comparison of On-Wafer and Split-Cylinder Resonator Measurements

Published

Author(s)

Michael D. Janezic, Uwe Arz

Abstract

We examine a broadband method to extract the relative permittivity and loss tangent of low-loss dielectric substrates from on-wafer scattering-parameter measurements of coplanar waveguides of differing lengths. To validate this method, we compare with measurements performed using two different split-cylinder resonators and demonstrate agreement over a broad frequency range.
Conference Dates
October 27-31, 2008
Conference Location
Amsterdam
Conference Title
European Microwave Week 2008

Citation

Janezic, M. and Arz, U. (2008), Broadband Dielectric Material Characterization: A Comparison of On-Wafer and Split-Cylinder Resonator Measurements, European Microwave Week 2008, Amsterdam, -1, [online], https://doi.org/10.1109/EUMC.2008.4751602 (Accessed April 14, 2024)
Created October 27, 2008, Updated November 10, 2018