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PUBLICATIONS

Broadband Dielectric Material Characterization: A Comparison of On-Wafer and Split-Cylinder Resonator Measurements

Published

Author(s)

Michael D. Janezic, Uwe Arz

Abstract

We examine a broadband method to extract the relative permittivity and loss tangent of low-loss dielectric substrates from on-wafer scattering-parameter measurements of coplanar waveguides of differing lengths. To validate this method, we compare with measurements performed using two different split-cylinder resonators and demonstrate agreement over a broad frequency range.
Conference Dates
October 27-31, 2008
Conference Location
Amsterdam
Conference Title
European Microwave Week 2008
Pub Type
Conferences

Download Paper

DOI Link
Electronics and Materials

Citation

Janezic, M. and Arz, U. (2008), Broadband Dielectric Material Characterization: A Comparison of On-Wafer and Split-Cylinder Resonator Measurements, European Microwave Week 2008, Amsterdam, -1, [online], https://doi.org/10.1109/EUMC.2008.4751602 (Accessed October 16, 2025)

Issues

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Created October 27, 2008, Updated November 10, 2018
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