Janezic, M.
and Arz, U.
(2008),
Broadband Dielectric Material Characterization: A Comparison of On-Wafer and Split-Cylinder Resonator Measurements, European Microwave Week 2008, Amsterdam, -1, [online], https://doi.org/10.1109/EUMC.2008.4751602
(Accessed December 2, 2024)
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Broadband Dielectric Material Characterization: A Comparison of On-Wafer and Split-Cylinder Resonator Measurements
Published
Author(s)
, Uwe Arz
Abstract
We examine a broadband method to extract the relative permittivity and loss tangent of low-loss dielectric substrates from on-wafer scattering-parameter measurements of coplanar waveguides of differing lengths. To validate this method, we compare with measurements performed using two different split-cylinder resonators and demonstrate agreement over a broad frequency range.Conference Dates
October 27-31, 2008
Conference Location
Amsterdam
Conference Title
European Microwave Week 2008
Pub Type
Conferences
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Created October 27, 2008, Updated November 10, 2018