U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

AWS-3 LTE Impacts on Aeronautical Mobile Telemetry

Published

Author(s)

William F. Young, Duncan McGillivray, Adam Wunderlich, Mark Krangle, Jack Sklar, Aric Sanders, Keith Forsyth, Mark A. Lofquist, Dan Kuester

Abstract

This technical report details an effort to design, demonstrate, and validate a test methodology to measure the impacts of Long Term Evolution (LTE) User Equipment (UE) emissions in the advanced wireless services 3 (AWS-3) band on aeronautical mobile telemetry (AMT) systems operating in the adjacent AMT band. Impacts are assessed by collecting and analyzing AMT system-provided key performance indicators (KPIs), such as bit error rate (BER). The validation process includes the capture and analysis for multiple adjacent band emissions (ABE) and AMT transmission combinations and conditions. The analysis here centers around AMT system behavior with and without the presence of ABE.
Citation
Technical Note (NIST TN) - 2140
Report Number
2140
NIST Pub Series
Technical Note (NIST TN)
Pub Type
NIST Pubs

Download Paper

https://doi.org/10.6028/NIST.TN.2140
Local Download
Wireless (RF) and Advanced communications

Citation

Young, W. , McGillivray, D. , Wunderlich, A. , Krangle, M. , Sklar, J. , Sanders, A. , Forsyth, K. , Lofquist, M. and Kuester, D. (2021), AWS-3 LTE Impacts on Aeronautical Mobile Telemetry, Technical Note (NIST TN), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.TN.2140, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=931529 (Accessed October 12, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created February 25, 2021, Updated October 12, 2021