Karmann, A.
, Wesch, W.
, Weber, B.
, Borner, H.
and Jentschel, M.
(2000),
Application of GRID to Foreign Atom Localization in Single Crystals, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed October 15, 2024)
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Application of GRID to Foreign Atom Localization in Single Crystals
Published
Author(s)
A Karmann, W Wesch, B Weber, H G. Borner, M Jentschel
Citation
Journal of Research (NIST JRES) -
Volume
105 No. 1
NIST Pub Series
Pub Type
NIST Pubs
Keywords
erbium, gamma-spectroscopy, impurity location, lifetime, YAlO<sub>3</sub>
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created April 1, 2000, Updated February 17, 2017