Angularly-Selective Transmission Imaging in a Scanning Electron Microscope
Jason D. Holm, Robert R. Keller
This contribution presents recent advances in imaging control conditions for transmission scanning electron microscopy (t-SEM) by means of angularly-selective electron collection with a commercial scanning transmission electron microscopy-in-scanning electron microscope (STEM-in-SEM) detector. A modular aperture system that can enhance the imaging capabilities of nearly any transmission detector is described, and several imaging examples are provided.
and Keller, R.
Angularly-Selective Transmission Imaging in a Scanning Electron Microscope, Ultramicroscopy, [online], https://doi.org/10.1016/j.ultramic.2016.05.001
(Accessed April 11, 2021)