Asher, S.
, Nelson, A.
, Mason, A.
, Swartzlander, A.
, Dhere, R.
, Kazmerski, L.
, Halbritter, J.
, Harvey, T.
, Beall, J.
and Ono, R.
(1989),
Analysis of the YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7</sub>/SrTiO<sub>3</sub> Interface as a Function of Post-Deposition Annealing, Proc., Amer. Vacuum Soc., High Tc Superconducting Thin Films, Processing, Characterization, and Applications, Boston, MA, USA
(Accessed December 12, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Analysis of the YBa2Cu3O7/SrTiO3 Interface as a Function of Post-Deposition Annealing
Published
Author(s)
S. E. Asher, A. J. Nelson, A. R. Mason, A. B. Swartzlander, R. G. Dhere, L. L. Kazmerski, J. Halbritter, , ,
Proceedings Title
Proc., Amer. Vacuum Soc., High Tc Superconducting Thin Films, Processing, Characterization, and Applications
Volume
9
Conference Location
Boston, MA, USA
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created December 30, 1989, Updated October 12, 2021