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Analysis of the YBa2Cu3O7/SrTiO3 Interface as a Function of Post-Deposition Annealing

Published

Author(s)

S. E. Asher, A. J. Nelson, A. R. Mason, A. B. Swartzlander, R. G. Dhere, L. L. Kazmerski, J. Halbritter, Todd E. Harvey, James A. Beall, Ronald H. Ono
Proceedings Title
Proc., Amer. Vacuum Soc., High Tc Superconducting Thin Films, Processing, Characterization, and Applications
Volume
9
Conference Location
Boston, MA, USA

Citation

Asher, S. , Nelson, A. , Mason, A. , Swartzlander, A. , Dhere, R. , Kazmerski, L. , Halbritter, J. , Harvey, T. , Beall, J. and Ono, R. (1989), Analysis of the YBa<sub>2</sub>Cu<sub>3</sub>O<sub>7</sub>/SrTiO<sub>3</sub> Interface as a Function of Post-Deposition Annealing, Proc., Amer. Vacuum Soc., High Tc Superconducting Thin Films, Processing, Characterization, and Applications, Boston, MA, USA (Accessed April 23, 2024)
Created December 30, 1989, Updated October 12, 2021