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Analysis of Persistent Photoconductivity Due to Potential Barriers

Published

Author(s)

J R. Lowney, Santos D. Mayo
Proceedings Title
Proc., Third Workshop on Radiation-Induced and/or Process-Related Electrically Active Defects in Semiconductor-Insulated Systems
Conference Dates
September 10-13, 1991
Conference Location
Research Triangle Park, NC, USA

Citation

Lowney, J. and Mayo, S. (1991), Analysis of Persistent Photoconductivity Due to Potential Barriers, Proc., Third Workshop on Radiation-Induced and/or Process-Related Electrically Active Defects in Semiconductor-Insulated Systems, Research Triangle Park, NC, USA (Accessed October 14, 2024)

Issues

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Created December 30, 1991, Updated October 12, 2021