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Algorithm for Scanned Probe Microscope Image Simulation, Surface Reconstruction, and Tip Estimation

Published

Author(s)

John S. Villarrubia
Citation
Journal of Research (NIST JRES) -
Volume
102 No. 4

Keywords

algorithms, atomic force microscopy, blind reconstruction, dimensional metrology, image simulation, mathematical morphology, scanned probe microscopy, scanning tunneling microscopy, surface reconstruction

Citation

Villarrubia, J. (1997), Algorithm for Scanned Probe Microscope Image Simulation, Surface Reconstruction, and Tip Estimation, Journal of Research (NIST JRES), National Institute of Standards and Technology, Gaithersburg, MD (Accessed May 27, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created July 1, 1997, Updated February 19, 2017