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PUBLICATIONS

AFM Observations of Slip Band Development in AI Single Crystals

Published

Author(s)

D E. Kramer, M Savage, Lyle E. Levine

Abstract

In situ atomic force microscopy (AFM) is used to observe the structure and evolution of slip bands on the surface of plastically deformed aluminum single crystals. Both the structure and evolution of the slip bands are observed to be a function of the tensile axis. Near the [001] tensile axis, slip bands are observed to grow to a height of approximately 250 nm over 2% plastic strain and then cease operation. Toward the stable [112] orientation, slip bands are observed to evolve continuously. Near the [111]tensile axis, wavy slip bands in which multiple systems are active in the same crystal region are observed. Other behavior such as the operation of unpredicted slip systems are also discussed.
Citation
Acta Materialia
Pub Type
Journals

Keywords

AFM, dislocations, plastic deformation, slip bands

Citation

Kramer, D. , Savage, M. and Levine, L. (2008), AFM Observations of Slip Band Development in AI Single Crystals, Acta Materialia (Accessed April 19, 2024)

Created October 16, 2008