AFM Observations of Slip Band Development in AI Single Crystals
D E. Kramer, M Savage, Lyle E. Levine
In situ atomic force microscopy (AFM) is used to observe the structure and evolution of slip bands on the surface of plastically deformed aluminum single crystals. Both the structure and evolution of the slip bands are observed to be a function of the tensile axis. Near the  tensile axis, slip bands are observed to grow to a height of approximately 250 nm over 2% plastic strain and then cease operation. Toward the stable  orientation, slip bands are observed to evolve continuously. Near the tensile axis, wavy slip bands in which multiple systems are active in the same crystal region are observed. Other behavior such as the operation of unpredicted slip systems are also discussed.