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Accurate Measurements of the Intrinsic Surface Impedance of Thin Films Using a Modified Two-Tone Resonator Method

Published

Author(s)

Jae H. Lee, James C. Booth, Kenneth Leong, David A. Rudman

Abstract

We propose a modified two-tone method that could be used for sensitive measurements of the intrinsic microwave surface impedance
Citation
IEEE Xplore Digital Library

Keywords

Dielectric resonator, intrinsic surface impedance, TE mode, YBCO film.

Citation

Lee, J. , Booth, J. , Leong, K. and Rudman, D. (2005), Accurate Measurements of the Intrinsic Surface Impedance of Thin Films Using a Modified Two-Tone Resonator Method, IEEE Xplore Digital Library (Accessed June 19, 2024)

Issues

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Created June 13, 2005, Updated January 27, 2020