Lee, J.
, Booth, J.
, Leong, K.
and Rudman, D.
(2005),
Accurate Measurements of the Intrinsic Surface Impedance of Thin Films Using a Modified Two-Tone Resonator Method, IEEE Xplore Digital Library (Accessed May 2, 2026)
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Accurate Measurements of the Intrinsic Surface Impedance of Thin Films Using a Modified Two-Tone Resonator Method
Published
Author(s)
, , ,
Abstract
We propose a modified two-tone method that could be used for sensitive measurements of the intrinsic microwave surface impedanceCitation
IEEE Xplore Digital Library
Pub Type
Journals
Keywords
Dielectric resonator, intrinsic surface impedance, TE mode, YBCO film.
Citation
Issues
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Created June 13, 2005, Updated January 27, 2020