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Acceptance Angle Control for Improved Transmission Imaging in an SEM

Published

Author(s)

Jason D. Holm, Robert R. Keller

Abstract

This contribution presents a simple, cost-effective modular aperture system enabling comprehensive acceptance angle control for STEM-in-SEM imaging. The system is briefly described, and different ways to use it are explained. To demonstrate the utility of the approach, a few samples are examined using the new system with comparisons to images from traditional SEM detectors. We show that the system enables conventional STEM imaging modes ranging from brightfield to high-angle annular darkfield (that is, Z-contrast), thin annular detection schemes, and even some non-conventional imaging modes.
Citation
Microscopy Today
Volume
25
Issue
2

Citation

Holm, J. and Keller, R. (2017), Acceptance Angle Control for Improved Transmission Imaging in an SEM, Microscopy Today, [online], https://doi.org/10.1017/S1551929516001267 (Accessed April 13, 2024)
Created March 1, 2017, Updated November 10, 2018