Geist, J.
, Stapelbroek, M.
and Petroff, M.
(1989),
The Absorption Cross Section of As in Si, SPIE, International Society for Optical Engineering, Test and Evaluation of Infrared Detectors and Arrays, Orlando, FL
(Accessed December 9, 2024)
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The Absorption Cross Section of As in Si
Published
Author(s)
, M. G. Stapelbroek, M. D. Petroff
Volume
1108
Conference Dates
March 27-28, 1989
Conference Location
Orlando, FL
Conference Title
SPIE, International Society for Optical Engineering, Test and Evaluation of Infrared Detectors and Arrays
Pub Type
Conferences
Citation
Issues
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Created December 31, 1989, Updated February 19, 2017