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The 2003 Interagency Program Review of the Government Agencies Technology Exchange in Manufacturing (GATE-M)

Published

Author(s)

David C. Stieren

Abstract

This report describes the proceedings and results of the 2003 Interagency Program Review conducted by the Government Agencies Technology Exchange in Manufacturing (GATE-M). This Review was held at the National Institute of Standards and Technology (NIST) in Gaithersburg, Maryland, on June 24-25, 2003. The purpose of the Review was to provide a forum for the agencies participating or interested in GATE-M to exchange information about agency activities in the two areas that have been identified for joint address by GATE-M. These two areas are Intelligence in Manufacturing and Nano -/ Micro-Scale Systems and Technologies.
Citation
NIST Interagency/Internal Report (NISTIR) - 7076
Report Number
7076

Keywords

DOD, DOE, GATE-M, Intelligence in Manufacturing, manufacturing R&D, Nano- / Micro-Scale Systems and Tech., NASA, NIST, NSF

Citation

Stieren, D. (2003), The 2003 Interagency Program Review of the Government Agencies Technology Exchange in Manufacturing (GATE-M), NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD (Accessed July 17, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 1, 2003, Updated October 16, 2008