Stieren, D.
(2003),
The 2003 Interagency Program Review of the Government Agencies Technology Exchange in Manufacturing (GATE-M), NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD (Accessed April 30, 2026)
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The 2003 Interagency Program Review of the Government Agencies Technology Exchange in Manufacturing (GATE-M)
Published
Author(s)
Abstract
This report describes the proceedings and results of the 2003 Interagency Program Review conducted by the Government Agencies Technology Exchange in Manufacturing (GATE-M). This Review was held at the National Institute of Standards and Technology (NIST) in Gaithersburg, Maryland, on June 24-25, 2003. The purpose of the Review was to provide a forum for the agencies participating or interested in GATE-M to exchange information about agency activities in the two areas that have been identified for joint address by GATE-M. These two areas are Intelligence in Manufacturing and Nano -/ Micro-Scale Systems and Technologies.Citation
NIST Interagency/Internal Report (NISTIR) - 7076
Report Number
7076
NIST Pub Series
Pub Type
NIST Pubs
Keywords
DOD, DOE, GATE-M, Intelligence in Manufacturing, manufacturing R&D, Nano- / Micro-Scale Systems and Tech., NASA, NIST, NSF
Citation
Issues
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Created December 1, 2003, Updated October 16, 2008