U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Websites

NIST Physics Laboratory WWW page

Author(s)
Jeffrey Chang, Pouya Dianat, Robert A. Dragoset, A R. Kishore, Karen J. Olsen, Alicia M. Sansonetti, D J. Schwab, G G. Wiersma

W3C XML Schema Test Suite

Author(s)
John M. Tebbutt, Anthony V. Cincotta
The National Software Reference Library (NSRL) of the U.S. National Institute of Standards and Technology (NIST) collects software from various sources and...

ebXML Technologies

Author(s)
Michael J. Kass
The National Software Reference Library (NSRL) of the U.S. National Institute of Standards and Technology (NIST) collects software from various sources and...

Conformance Resources and Information

Author(s)
Mark Skall
The National Software Reference Library (NSRL) of the U.S. National Institute of Standards and Technology (NIST) collects software from various sources and...

Report on the Second Modes of Operation Workshop

Author(s)
Morris J. Dworkin
NIST sponsored a public workshop for the analysis of block cipher modes of operation on August 24, 2001, in Goleta, California. This report summarizes the...

Machine Translation Website

Author(s)
John S. Garofolo
This paper demonstrates that, for large-scale tests, the match and non-match similarity scores have no specific underlying distribution function. The forms of...

Structural Ceramics Database (Version June 2001)

Author(s)
R G. Munro
An update of the NIST Standard Reference Database Number 30, the Structural Ceramics Database, has been completed. This update, designated here as Version June...

XSL Toolbox

Author(s)
Joshua Lubell
The XSLToolbox is a growing collection of tools whose purpose is to make it easier for XML (Extensible Markup Language) applications to talk to one another...

Index of Refraction of Air

Author(s)
Jack A. Stone Jr., Jay H. Zimmerman
These Web pages are intended primarily as a computational tool that can be used to calculate the refractive index of air for a given wavelength of light and...

Texture Plus

Author(s)
Mark D. Vaudin
TexturePlus is a Win '95 or later software package that analyzes crystallographic texture in bulk and thin film specimens. The software analyzes data obtained...

A Visualization Approach to Dealing with Log Data

Author(s)
Emile L. Morse, Michelle P. Steves
The CollabLogger is a visual tool that supports usability analyses of human-computer interaction in a team environment. Participants in our computer-mediated...

Abstracts for the MSEL Assessment Panel, March 2001

Author(s)
Leslie E. Smith, Alamgir Karim, Leonid A. Bendersky, C Lu, J J. Scott, Ichiro Takeuchi, Kathleen M. Flynn, Vinod K. Tewary, Davor Balzar, G A. Alers, Stephen E. Russek, Charles C. Han, Haonan Wang, William E. Wallace, Daniel A. Fischer, K Efimenko, Wen-Li Wu, Jan Genzer, Joseph C. Woicik, Thomas H. Gnaeupel-Herold, Henry J. Prask, Charles F. Majkrzak, Norman F. Berk, John G. Barker, Charles J. Glinka, Eric K. Lin, Ward L. Johnson, Paul R. Heyliger, David T. Read, R R. Keller, J Blendell, Grady S. White, Lin-Sien H. Lum, Eric J. Cockayne, Igor Levin, C E. Johnson, Maureen E. Williams, Gery R. Stafford, William J. Boettinger, Kil-Won Moon, Daniel Josell, Daniel Wheeler, Thomas P. Moffat, W H. Huber, Lee J. Richter, Clayton S. Yang, Robert D. Shull, R A. Fry, Robert D. McMichael, William F. Egelhoff Jr., Ursula R. Kattner, James A. Warren, Jonathan E. Guyer, Steven P. Mates, Stephen D. Ridder, Frank S. Biancaniello, D Basak, Jon C. Geist, Kalman D. Migler
Abstracts relating to research and development in the NIST Materials Science and Engineering Laboratory (MSEL) are presented for a poster session to be...

Thickness measurement of nm HfO2 films

Author(s)
Kyung Joong KIM, A Kim, S.C. Kim, S.W. Song, H. Ruh, W.E.S. Unger, J. Radnik, J. Mata-Salazar, J.M. Juarez-Garcia, O. Cortazar-Martinez, A. Herrera-Gomez, P.E. Hansen, J.S. Madsen, C.A. Senna, B.S. Archanjo, J.C. Damasceno, C.A. Achete, H. Wang, M. Wang, Donald Windover, Eric B. Steel, A. Kurokawa, T. Fujimoto, Y. Azuma, S. Terauchi, L. Zhang, W.A. Jordaan, S.J. Spencer, A.G. Shard, L. Koenders, M. Krumrey, I. Busch, C. Jeynes
A pilot study for the thickness measurement of HfO2 films was performed by the Surface Analysis Working Group (SAWG) of the Consultative Committee for Amount of...

Modeling, Simulation and Prediction of Rockwell Hardness Indentation

Author(s)
Li Ma, J Zhou, Theodore V. Vorburger, R Dewit, Richard J. Fields, Samuel Low, Jun-Feng Song
Rockwell hardness test, as a measure of the resistance of a material to localized plastic deformation, is a valuable and widely used mechanical test. However...
Was this page helpful?