Websites

Machine Translation Website

September 1, 2001

Author(s)

John S. Garofolo

This paper demonstrates that, for large-scale tests, the match and non-match similarity scores have no specific underlying distribution function. The forms of

Structural Ceramics Database (Version June 2001)

June 1, 2001

Author(s)

R G. Munro

An update of the NIST Standard Reference Database Number 30, the Structural Ceramics Database, has been completed. This update, designated here as Version June

AnEig: A Routine to Calculate the Eigenvalues and Eigenvectors of a Tensor Related to the Spatial Dispersion of Birefringence

June 1, 2001

Author(s)

Zachary H. Levine

A Fortran Subroutine and Mathematica function are given which calculate the eigenvalues and eigenvectors of a tensor which gives the anisotropy of the optical

Cryptographic Protection for the Twenty-First Century

March 1, 2001

Author(s)

Elaine B. Barker

In 2000, the National Institute of Standards and Technology (NIST) announced the selection of a new encryption algorithm that will be used to protect sensitive

XSL Toolbox

March 1, 2001

Author(s)

Joshua Lubell

The XSLToolbox is a growing collection of tools whose purpose is to make it easier for XML (Extensible Markup Language) applications to talk to one another

Index of Refraction of Air

February 16, 2001

Author(s)

Jack A. Stone Jr., Jay H. Zimmerman

These Web pages are intended primarily as a computational tool that can be used to calculate the refractive index of air for a given wavelength of light and

Texture Plus

February 1, 2001

Author(s)

Mark D. Vaudin

TexturePlus is a Win '95 or later software package that analyzes crystallographic texture in bulk and thin film specimens. The software analyzes data obtained

Physics Laboratory Web Page: Diatomic Spectral Database http://physics.nist.gov/molspec

February 1, 2001

Author(s)

Francis J. Lovas, E Tiemann, J S. Coursey, Robert A. Dragoset

All of the rotational spectral lines observed and reported in the open literature for 83 diatomic molecules have been tabulated. The isotopic molecular species

Ceramic Thin Film Measurements and Standards Program Web Page

February 1, 2001

Author(s)

Charles E. Bouldin, Debra Kaiser, Peter K. Schenck

Ceramic materials are increasingly being used in thin film form in electronic, optical, optoelectronic, and magnetic devices. Our program addresses measurements

A Visualization Approach to Dealing with Log Data

January 29, 2001

Author(s)

Emile L. Morse, Michelle P. Steves

The CollabLogger is a visual tool that supports usability analyses of human-computer interaction in a team environment. Participants in our computer-mediated

Abstracts for the MSEL Assessment Panel, March 2001

January 26, 2001

Author(s)

Leslie E. Smith, Alamgir Karim, Leonid A. Bendersky, C Lu, J J. Scott, Ichiro Takeuchi, Kathleen M. Flynn, Vinod K. Tewary, Davor Balzar, G A. Alers, Stephen E. Russek, Charles C. Han, Haonan Wang, William E. Wallace, Daniel A. Fischer, K Efimenko, Wen-Li Wu, Jan Genzer, Joseph C. Woicik, Thomas H. Gnaeupel-Herold, Henry J. Prask, Charles F. Majkrzak, Norman F. Berk, John G. Barker, Charles J. Glinka, Eric K. Lin, Ward L. Johnson, Paul R. Heyliger, David T. Read, R R. Keller, J Blendell, Grady S. White, Lin-Sien H. Lum, Eric J. Cockayne, Igor Levin, C E. Johnson, Maureen E. Williams, Gery R. Stafford, William J. Boettinger, Kil-Won Moon, Daniel Josell, Daniel Wheeler, Thomas P. Moffat, W H. Huber, Lee J. Richter, Clayton S. Yang, Robert D. Shull, R A. Fry, Robert D. McMichael, William F. Egelhoff Jr., Ursula R. Kattner, James A. Warren, Jonathan E. Guyer, Steven P. Mates, Stephen D. Ridder, Frank S. Biancaniello, D Basak, Jon C. Geist, Kalman D. Migler

Abstracts relating to research and development in the NIST Materials Science and Engineering Laboratory (MSEL) are presented for a poster session to be

UTC, GPS Timing and Synchronization in Telecommunications

January 1, 2001

Author(s)

Marc A. Weiss

General Spectroscopic Analysis Software (MW/IR/UV Spectroscopy)

January 1, 2001

Author(s)

David F. Plusquellic

SCATMECH: Polarized Light Scattering C++ Class Library, Version 2.00, software and documentation

January 1, 2001

Author(s)

Thomas A. Germer

The Next-Generation in Traceability: e-Calibrations

January 1, 2001

Author(s)

Marc F. Desrosiers, V Y. Nagy

NIST Physics Laboratory WWW page

January 1, 2001

Author(s)

Robert A. Dragoset, A R. Kishore, Karen J. Olsen, Alicia M. Sansonetti, D J. Schwab, G G. Wiersma

An Examination of Tantalum Pentoxide Thin Dielectric Films Using Grazing Incidence X-Ray Reflectivity and Powder Diffraction

January 1, 2001

Author(s)

C H. Russell, S M. Owens, R Deslattes, A C. Diebold

New materials with high dielectric constants (high-K materials) are needed for the further development of dynamic random access memory (DRAM) chips. The problem

Thickness measurement of nm HfO2 films

January 1, 2001

Author(s)

Kyung Joong KIM, A Kim, S.C. Kim, S.W. Song, H. Ruh, W.E.S. Unger, J. Radnik, J. Mata-Salazar, J.M. Juarez-Garcia, O. Cortazar-Martinez, A. Herrera-Gomez, P.E. Hansen, J.S. Madsen, C.A. Senna, B.S. Archanjo, J.C. Damasceno, C.A. Achete, H. Wang, M. Wang, Donald Windover, Eric B. Steel, A. Kurokawa, T. Fujimoto, Y. Azuma, S. Terauchi, L. Zhang, W.A. Jordaan, S.J. Spencer, A.G. Shard, L. Koenders, M. Krumrey, I. Busch, C. Jeynes

A pilot study for the thickness measurement of HfO2 films was performed by the Surface Analysis Working Group (SAWG) of the Consultative Committee for Amount of

Modeling, Simulation and Prediction of Rockwell Hardness Indentation

January 1, 2001

Author(s)

Li Ma, J Zhou, Theodore V. Vorburger, R Dewit, Richard J. Fields, Samuel Low, Jun-Feng Song

Rockwell hardness test, as a measure of the resistance of a material to localized plastic deformation, is a valuable and widely used mechanical test. However

Report on the Symmetric Key Block Cipher Modes of Operation Workshop

December 1, 2000

Author(s)

Morris J. Dworkin

A workshop was held to discuss the modes of operation for symmetric key block cipher algorithms on October 20, 2000 at the Baltimore Convention Center in

Federal Information Technology Security Assessment Framework

November 28, 2000

Author(s)

E Roback

[Prepared for the CIO Council's Security, Privacy, and Critical Infrastructure Committee] The Federal Information Technology (IT) Security Assessment Framework

Open Architecture Controls: The Key to Interoperability

November 2, 2000

Author(s)

John Evans

Integration costs for industrial robots are two to four times the cost of the robots themselves. As manufacturers work toward ever shorter product cycles and

TREC Video Retrieval Evaluation Website

November 1, 2000

Author(s)

Paul D. Over

This paper demonstrates that, for large-scale tests, the match and non-match similarity scores have no specific underlying distribution function. The forms of

BLCC-NIST Building Life-Cycle Cost Program, Version 5.0

October 1, 2000

Author(s)

S Fuller, A Boyles, Bruce R. Miller

The BLCC5 Building Life-Cycle Cost Program provides economic analysis of projects for which both initial capital costs and future operational costs need to be

ACE Website

September 1, 2000

Author(s)

John S. Garofolo

This paper demonstrates that, for large-scale tests, the match and non-match similarity scores have no specific underlying distribution function. The forms of

A Visualization Approach to Dealing with Log Data

July 1, 2000

Author(s)

Michelle P. Steves, Emile L. Morse

The CollabLogger is a visual tool that supports usability analyses of human-computer interaction in a team environment. Participants in our computer-mediated

Proceedings of the Open Architecture in Metrology Automation Workshop, Gaithersburg, MD, May 2 & 3, 2000

May 1, 2000

Author(s)

John A. Horst, Elena R. Messina, John Evans, Dennis A. Swyt

Metrology, Standards

Ceramic Manufacturing Program World Wide Web Site

April 1, 2000

Author(s)

Vincent A. Hackley

The Ceramic Manufacturing Program (CMP) World Wide Web Site contains general information on CMP research projects, personnel, facilities and industrial

A Frequency Stabilized Laser Array for Use in Displacement Metrology

February 17, 2000

Author(s)

J Pedulla, R Deslattes, John R. Lawall

We have developed a frequency stabilized laser system to supply light to measure atomic-scale displacements of a stage moved in real time. Each laser in the

Compressible Fluid Dynamics in Materials Processing

February 1, 2000

Author(s)

Steven P. Mates

Two widely-utilized materials processing techniques, namely liquid metal atomization and thermal spraying, heavily involve compressible fluid dynamics. In