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Journals

The Importance of Importance Sampling

Author(s)
Isabel M. Beichl, F Sullivan
This is a tutorial article on Monte Carlo technique of importance sampling that has been under-appreciated. We recently used it with great success and so we

Absolute Frequency Atlas of Molecular I2 Lines at 532 NM

Author(s)
Jun Ye, Lennart Robertsson, S Picard, L -. Ma, John L. Hall
With the aid of two iodine spectrometers, we report for the first time the measurement of the hyperfine splittings of the P(54) 32-0 and R(57)32-0 transitions

Improving Kinematic Touch Trigger Probe Performance

Author(s)
Steven D. Phillips, William T. Estler
Kinematic touch trigger probes are widely used on CMMs. This article gives CMM users advice on how to minimize the systematic errors associated with this class

Forward

Author(s)
Norman B. Belecki
The National Institute of Standards and Technology (NIST) hosted the 1998 Conference on Precision Electromagnetic Measurements (CPEM'98) in the Washington

Guest Editorial

Author(s)
Barry A. Bell
The National Institute of Standards and Technology hosted the 1998 Conference on Precision Electromagnetic Measurements (CPEM >98) in the Washington Renaissance

Polycapillary X-Ray Optic Spectral Gain and Transmission

Author(s)
J E. Gormley, Eric B. Steel, Q Xiao, Terrence J. Jach
Polycapillary x-ray optics are gaining increased attention as their transmission characteristics and manufacturing difficulties are better understood. This

Fabrication of High-Value Standard Resistors

Author(s)
Ronald F. Dziuba, Dean G. Jarrett, L. L. Scott, Andrew J. Secula
The National Institute of Standards and Technology (NIST) has fabricated stable, transportable 10 MΩ} and 1 GΩ} standard resistors for use in an international

Calibration of Dissipation Factor Standards

Author(s)
Eric D. Simmon, Gerald FitzPatrick, O. Petersons
Working standards for dissipation factor (D) standards obtained by connecting a shielded three-terminal capacitor in series with a shielded precision resistor
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