NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.
Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.
An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
S Sambasivan, Daniel A. Fischer, M C. Shen, Stephen M. Hsu
In a human hip joint, the motion is complex and consists of flexion/extension, abduction, and adduction. Laboratory studies have shown that these motions
This paper is an interim report on our efforts at NIST to construct an information discovery tool through the fusion of Hypertext and Information Retrieval (IR)
Brute force exploration of the simple cubic effective cluster interaction space indicates that linear triplet interaction is both necessary and sufficient to
This paper examines a wide class of ill-posed initial value problems for partial differential equations, and surveys logarithmic convexity results leading to
The general theories of the derivation of inverses of functions from their power series and asymptotic expansions are discussed and compared. The asymptotic
This article extends the results of [3] by establishing sufficient conditions for the limit distribution of products of i.i.d. 2 x 2 random stochastic matrices
Impressive advances are being made in the field of display metrology, as illustrated in standards such as the Video Electronics Standards Association's Flat
Debra L. Kaiser, Mark D. Vaudin, L D. Rotter, John E. Bonevich, J T. Armstrong
(Ba,Sr) yTiO 2+y thin films with 0.34 {1-xSr xTiO 3 (x {aproximately equal to} 0.06) and an amorphous phase. The orientation of the tetragonal Ba 1-xSr xTiO 3
The electronic structure and spectroscopy of the oxovanadium catalytic center on a silica surface is modeled with the molecule OV(OSIH 3)3. Excited electronic
Imagine a world without desk-top laser printers or laser fax machines, without cellular telephones or pagers or global positioning, without compact disk (CD)
We evaluated sources of varience in the measurement of the surface zeta potential of flat sheet specimens of cellulose di/triacetate membranes with a commercial
Billy W. Mangum, P Bloembergen, M V. Chattle, B Fellmuth, P Marcarino, A I. Pokhodun
Techniques are recommended for comparisons, at the highest levels of accuracy, of fixed-point cells of the defining fixed points, excluding the vapour-pressure
We, at the National Institute of Standards and Technology (NIST), are in the process of instituting and assessing collaboration technologies for manufacturing
Nominally identical ceramic-element ultrasonic transducers of the type used in the aerospace and metals industries for nondestructive evaluation (NDE) often
Ultrasonic velocity measurements were used to determine the dynamic elastic moduli small metal samples to a 2[sigma] measurement uncertainty of less than one
Historically, various techniques have been used in acoustics to attempt to establish and to measure sound pressures in the pressure field (spatially uniform
This is the second in a series of two papers concerned with high speed grinding of silicon nitride with electroplated diamond wheels. In a companion paper, it
T W. Hwang, Eric P. Whitenton, Nelson N. Hsu, Gerald V. Blessing, Christopher J. Evans
Acoustic emission monitoring of a machining process offers real-time sensory input which could provide tool condition and part quality information that is
Terrell A. Vanderah, Winnie K. Wong-Ng, B H. Toby, V. M. Browning, Robert D. Shull, Richard G. Geyer, Robert S. Roth
Single crystals of Ba 6Fe 45Ti 17O 106 and BaFe 11Ti 3O 23 were obtained as major and minor co-products, respectively, by slow-cooling an off-stoichiometric BaO
Steven D. Phillips, Bruce R. Borchardt, Daniel S. Sawyer, William T. Estler, K Eberhardt, M Levenson, Marjorie A. McClain, Ted Hopp
We describe a Monte Carlo simulation technique where known information about a metrology system is employed as a constraint to distinguish the errors associated