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Journals

Open Issues in Secure DNS Deployment

Author(s)
Ramaswamy Chandramouli, Scott W. Rose
This paper describes some practical administrative issues and challenges in the deployment of DNSSEC - an IETF specified suite of security measures for securing

An experiment for the precision measurement of the radiative decay mode of the neutron

Author(s)
R Cooper, Christopher D. Bass, E Beise, H Breuer, Jim Byrne, T E. Chupp, Kevin Coakley, Maynard S. Dewey, B Fisher, Changbo Fu, Thomas R. Gentile, M. McGonagle, Hans Pieter Mumm, Jeffrey S. Nico, Alan Keith Thompson, F E. Wietfeldt
The neutron typically beta decays into a proton, electron, and antineutrino. In some decays, it can be accompanied by a high energy photon. We recently

Dietary Supplement Standard Reference Materials

Author(s)
Lane C. Sander, Karen W. Phinney, Michele M. Schantz, Katherine E. Sharpless, Stephen A. Wise
In 1994, the U.S. Congress enacted the Dietary Supplement Health and Education Act to "protect the right of access of consumers to safe dietary supplements". In

Fitting Spheres to Range Data from 3D Imaging Systems

Author(s)
Marek Franaszek, Geraldine S. Cheok, Kamel S. Saidi, Christoph J. Witzgall
Two error functions used for nonlinear Least Squares (LS) fitting of spheres to range data from 3D imaging systems are discussed: orthogonal error function and

Uncertainty of timebase corrections

Author(s)
Chih-Ming Wang, Paul D. Hale, Dylan F. Williams
We develop a covariance matrix describing the uncertainty of a new timebase for waveform measurements determined with the National Institute of Standards and

Spectrum Simulation in DTSA-II

Author(s)
Nicholas W. Ritchie
Spectrum simulation is a useful practical and pedagogical tool. Particularly with complex samples or trace constituents, a simulation can help to understand the

The coefficient of thermal expansion of highly enriched 28Si

Author(s)
Ernest G. Kessler Jr., Guido Bartl, Arnold Nicolaus, Rene Schodel, Peter Becker
For the new definition of the SI-unit mass based on a fundamental constant, a redetermination of Avogadro s constant is the goal of an international

From the Editor's Desk: Why We Are Here

Author(s)
Catherine A. Remley
This is an Editorial for the October, 2009 issue of IEEE Microwave Magazine. Kate Remley, the Editor-in-Chief, writes about timely topics for the members of the

Photomask metrology using a 193 nm scatterfield microscope

Author(s)
Richard Quintanilha, Bryan M. Barnes, Martin Y. Sohn, Lowell P. Howard, Richard M. Silver, James E. Potzick, Michael T. Stocker
The current photomask linewidth Standard Reference Material (SRM) supplied by the National Institute of Standards and Technology (NIST), SRM 2059, is the fifth
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