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Conferences

Accurate Measurement of Optical Detector Nonlinearity

July 1, 1994

Author(s)

Shao Yang, Igor Vayshenker, Xiaoyu X. Li, Thomas Scott

Optical Detector Nonlinearity: A Comparison of Five Methods

July 1, 1994

Author(s)

Shao Yang, Igor Vayshenker, Xiaoyu X. Li, Thomas Scott

Optical Power Meter Calibration Using Tunable Laser Diodes

July 1, 1994

Author(s)

Igor Vayshenker, Xiaoyu X. Li, Thomas Scott

AC-DC Difference Characteristics of High-Voltage Thermal Voltage Converters

July 1, 1994

Author(s)

D. X. Huang, Thomas E. Lipe Jr., Joseph R. Kinard Jr., Clifton B. Childers

A High-Temperature Superconductor Cryogenic Current Comparator

July 1, 1994

Author(s)

Randolph Elmquist, Ronald F. Dziuba

Improvements to Automated System for Measuring Standard Resistors at NIST

July 1, 1994

Author(s)

Dean G. Jarrett, T. P. Moore

Audio-Frequency Analysis of Inductive Voltage Dividers Based on Structural Models

July 1, 1994

Author(s)

S. Avramov, Nile M. Oldham, Andrew D. Koffman, R W. Gammon

Improved Vacuum Thermocouples

July 1, 1994

Author(s)

H. Levinson, B. D. Inglis, Joseph R. Kinard Jr., D. E. Stollery

Design and Performance Evaluation of the NIST Digital Impedance Bridge

July 1, 1994

Author(s)

Bryan C. Waltrip, Nile M. Oldham

NIST Comparison of Resistances Based on the Calculable Capacitor and the Quantum Hall Effect

July 1, 1994

Author(s)

John Q. Shields, Ronald F. Dziuba, Randolph Elmquist, Lai H. Lee

The Present Watt Balance: A Measure of the Resolution

July 1, 1994

Author(s)

P. T. Olsen, Richard L. Steiner, George R. Jones Jr., Edwin R. Williams

Programmable Digitally Synthesized Source for Low-Frequency Calibrations

July 1, 1994

Author(s)

Nile M. Oldham, P. S. Hetrick, Mark E. Parker

Research on Flat Panel Display Measurements at the National Institute of Standards and Technology

July 1, 1994

Author(s)

B. F. Field, Edward F. Kelley, Charles D. Fenimore, Herbert S. Bennett

Instrumentation at the National Institute of Standards and Technology for Bidirectional Reflectance Distribution Function (BRDF) Measurement

July 1, 1994

Author(s)

Clara C. Asmail, C L. Cromer, James E. Proctor, J J. Hsia

Spatial Uniformity of Optical Detector Responsivity

July 1, 1994

Author(s)

David J. Livigni, Xiaoyu X. Li

Accurate CO₂ Laser Frequencies and Molecular Constants for Regular and New Hot Band Lines

June 27, 1994

Author(s)

Che-Chung Chou, Jow-Tsong Shy, A. G. Maki, L R. Zink, K M. Evenson

Progress Toward a Cryogenic ¹⁹⁹Hg⁺ Ion Frequency Standard

June 27, 1994

Author(s)

M E. Poitzsch, James C. Bergquist, Wayne M. Itano, David J. Wineland

Radiation Scattered by Two Touching Spheres

June 20, 1994

Author(s)

Egon Marx

During the manufacture of powder metal, the size distribution of the metal spheres can be determined to some extent by the distribution of light scattered by

A Reference Architecture for Control of Mechanical Systems

June 14, 1994

Author(s)

Thomas R. Kramer, M. K. Senehi, John L. Michaloski, Steven R. Ray, William G. Rippey, S Wallace

Control

The Role of Standards in Vacuum Electronics

June 1, 1994

Author(s)

Michael McLay

Handling Passwords with Security and Realiability in Background Processes

June 1, 1994

Author(s)

Don E. Libes

Traditionally, background automation of interactive processes meant giving up security and reliability. With the advent of software such as Expect for

Use of Higher-Order TEo k Modes in Dielectric Measurements of Dielectric Rod Resonators

June 1, 1994

Author(s)

Jerzy Krupka, Richard G. Geyer, D. Cros

Dielectric Properties of Materials at Cryogenic Temperatures and Microwave Frequencies

June 1, 1994

Author(s)

Richard G. Geyer, Jerzy Krupka

Distribution of Dielectric Relaxation Times and the Moment Problem

June 1, 1994

Author(s)

James R. Baker-Jarvis, Michael D. Janezic

Accurate Computations of Radar Cross Sections of Simple Objects

June 1, 1994

Author(s)

Lorant A. Muth, John M. Gary

Microwave Characterization of Printed Circuit Transmission Lines

June 1, 1994

Author(s)

Roger Marks, Dylan Williams

Performance Evaluation of New Digital Partial Discharge Recording and Analysis System

June 1, 1994

Author(s)

P. Von, Richard J. Van Brunt

Application of the NIST Testing Strategies to a Multirange Instrument

June 1, 1994

Author(s)

Andrew D. Koffman, T. M. Souders

Standards Development for Information Technology: Best Practices for the United States

June 1, 1994

Author(s)

J Morell, Selden Stewart

This report summarizes the deliberations and results of the workshop on, Standards Development for Information Technology: Best Practices for the United States

Widths and Propagation of a Truncated Gaussian Beam

June 1, 1994

Author(s)

Richard D. Jones, Thomas Scott

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