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Conferences

Improved Matrix Method for Tristimulus Colorimetry of Displays

January 1, 1997

Author(s)

Yoshihiro Ohno, Jonathan E. Hardis

Improved Photometric and Colorimetric Calibrations at NIST

January 1, 1997

Author(s)

Yoshihiro Ohno, M Navarro

Testing and Improving the Radiometric Accuracy of FT-IR Transmittance Measurements

January 1, 1997

Author(s)

Simon G. Kaplan, Leonard M. Hanssen, Raju V. Datla

Refractive Index of Fused Silica and Calcium Fluoride Near 193 nm

January 1, 1997

Author(s)

R Gupta, J H. Burnett, U Griesmann, J L. Dehmer, J R. Roberts

Electronic characteristic of Ge and InGaAs radiometers ed. by Bjorn F. Andresen; Marija Strojnik Scholl

January 1, 1997

Author(s)

George P. Eppeldauer

The Calibration of High-Dose Dosimeters in High-Energy Electron Beams

January 1, 1997

Author(s)

W L. Mclaughlin

Update to Nuclear Data Standards for Nuclear Measurements

January 1, 1997

Author(s)

Allan D. Carlson, S Chiba, F-J Hambsch, N Olsson, A N. Smirnov

Radiochromic Gel-Core Fluorinated-Polyethylene-Propylene Fiber Optics for Distributed Sensing of X and Gamma Rays

January 1, 1997

Author(s)

M Al-sheikhly, W L. Mclaughlin, C -. Hsu, A Christou

UV, Soft X-Ray, and Gamma-Ray High-Resolution Imaging and Discrimination by a Novel Photo-Polymer Film System

January 1, 1997

Author(s)

M Al-sheikhly, W L. Mclaughlin, A Christou, C A. Christou

On the Mechanism of Radiation-Induced Curing of Epoxy-Fiber Composites

January 1, 1997

Author(s)

A Al-sheikhly, W L. Mclaughlin

Intercomparison of Silicon Samples from the Avogadro Project

January 1, 1997

Author(s)

Ernest G. Kessler, Jr, J E. Schweppe, R Deslattes

Off-Line Quality Control for Bragg-Laue Optics

January 1, 1997

Author(s)

R Deslattes

Off-Line Quality Control for Bragg-Laue Optics

January 1, 1997

Author(s)

R Deslattes

Virtual Supply Chain Management: A Re-Engineering Approach Using Discrete Event Simulation

January 1, 1997

Author(s)

Shigeki Umeda, Albert W. Jones

Modern manufacturing enterprises must collaborate with a large number of suppliers to design and produce their products. Management of these supply chains is...

Establishing a Common Rockwell Hardness Scale Using Geometrically Calibrated Standard Diamond Indenters

January 1, 1997

Author(s)

Jun-Feng Song

Recently developed microform measurement techniques have reduced the measurement uncertainties in the geometry of Rockwell diamond indenters. In this paper, we...

Integral Equations for Scattering by a Particle in a Layer

January 1, 1997

Author(s)

Egon Marx

The single integral equation method is applied to the scattering of electromagnetic waves by particles in a layer on top of a substrate. A second layer on top...

Finish and Figure Metrology for Soft X-ray Optics

January 1, 1997

Author(s)

T Mcwaid

The performance of high quality optics relies heavily on their geometrical properties of surface finish and figure. The surface finish consists of the short...

Workshop Discussion: A Framework for Standards Development and the Future of the IASPM Workshops

January 1, 1997

Author(s)

John A. Dagata

A proposal to develop the Industrial Applications of Scanned Probe Microscopy (IASPM) workshops, which NIST has co-sponsored with Sematech, the ASTM E42.14...

Characterization of Multi-phase and Multi-component Polymers using the Atomic Force Microscope

January 1, 1997

Author(s)

Mark R. VanLandingham, John S. Villarrubia, G Meyers, M Dineen

Abstract not available.

Fabrication of Calibration Standards by Nanostructuring Procedures Using Scanning Tunneling Microscope (STM)

January 1, 1997

Author(s)

R Koning, L Koenders

To improve the achievable uncertainty of high resolution microscopes (Scanning Probe or Scanning Electron) attempts have been made to manufacture calibration...

The NIST Magnetic Imaging Reference Sample

January 1, 1997

Author(s)

Paul Rice, Stephen E. Russek, J Hoinville, Michael H. Kelley

We have further developed the NIST magnetic imaging reference sample to include a magnetic pattern which can indicate the magnetic polarity of a magnetic force...