FCMN

The International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (FCMN) brings together scientists and engineers interested in all aspects of the characterization technology needed for nanoelectronic materials and device research, development, integration, and manufacturing. All approaches are welcome: chemical, physical, electrical, magnetic, optical, in situ, and real-time control and monitoring. The semiconductor industry is evolving rapidly:  the conference  highlights major issues and provides critical reviews of important materials and structure characterization and nearline/inline metrology methods, including hardware, data analysis, and AI and machine learning, as the industry both extends the technology deep into the nanoscale and increases the diversity of devices and systems.

The conference consists of formal invited presentation sessions and poster sessions for contributed papers. The poster papers cover new developments in materials and structure characterization/metrology down to the nanoscale. The conference began in 1995, and this meeting is the 14th in the series.

Our most recent conference took place April 15-18, 2024, in Monterey, California. Click here for additional information on the 2024 event.

Many of the abstracts, posters, and invited presentation slides from our previous conferences are available on-line.

The next event is scheduled for March 16-19, 2026, in Monterey, California. Additional details will be available soon!