1992-present, NIST, Gaithersburg, MD
prior to 1991, Matsushita Electric Industrial Co. (Panasonic), Osaka, Japan
Ph.D. Engineering, Kyoto University, Japan
Yoshi Ohno is actively involved in research pertaining to photometry and colorimetry. Specific projects of interest include integrating sphere, luminous flux measurement, colorimetry of light sources, color rendering, spectroradiometry, photometry of flashing lights, and solid state lighting.
He is a Fellow of IESNA, currently serves as the Director of CIE Division 2, NIST representative for CCPR, Chair of CCPR Working Group of Key Comparisons, and active in technical committees in CIE, ISO, ANSI, and IESNA.
Ohno received Arthur S. Flemming Award in 2006, CIE de Boer Gold Pin Distinguished Service Award in 2007, and U.S. Department of Commerce Silver Medal Award in 2009.