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https://www.nist.gov/people/vincent-lee
Vincent Lee (Fed)
Dr. Lee is a guest researcher in the Dimensional Metrology Group in the Sensor Science Division of the Physical Measurement Laboratory (PML) at the National Institute of Standards and Technology (NIST).
Balasubramanian Muralikrishnan, Katharine Shilling, Vincent Lee, Olga Ridzel, Glenn Holland, John Villarrubia
We describe a method to calibrate angular positioning errors of a rotation stage using a laser tracker (LT), a plane mirror mounted on the stage, and stationary
Balasubramanian Muralikrishnan, Braden Czapla, Vincent Lee, Craig Shakarji, Daniel S. Sawyer, Saure Matthias
Laser trackers (LTs) are dimensional measurement instruments commonly employed in the manufacture and assembly of large structures. Terrestrial laser scanners
Octavio Icasio Hernandez, Alex Rocha De La Cruz, Balasubramanian Muralikrishnan, Vincent Lee, Wei Ren, Jose-Joel Gonzalez-Barbosa
Structured light projection systems (SLSs) are commonly used for precision dimensional measurements. These are active systems in that the projected pattern is
Marcos Motta de Souza, Bala Muralikrishnan, Vincent Lee, Daniel S. Sawyer
The Dimensional Metrology Group (DMG) at the National Institute of Standards and Technology (NIST) has a unique 60 m long length facility that provides