Dr. Lee is a mechanical engineer in the Dimensional Metrology Group in the Sensor Science Division of the Physical Measurement Laboratory (PML) at NIST. His research activities are in large scale coordinate metrology, length calibrations (tape measure, ball bar, scale bars), calibration artifact design, and documentary standards development. He is responsible for maintaining NIST's Long Range Interferometry (LoRI) laboratory, modernizing dimensional calibration facilities and equipment, Measuring Tape Calibrations, and Optical Flat Calibrations.
Judson C. French Award: For the initiative in overhauling the NIST photometry facility and services to meet the demands of the rapidly growing solid-state lighting industry.