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Shannon Duff (Fed)

Shannon Duff is an Electronics Engineer in the Quantum Sensors Group within the Quantum Electromagnetics Division of the Physical Measurement Laboratory at NIST in Boulder, CO.  Upon joining the Quantum Sensors Group in 2015, she began leading the development of micro-fabrication processes for densely packed, large-format arrays of superconducting transition edge sensor (TES) polarimeters for making precise measurements of the Cosmic Microwave Background (CMB).  This development has enabled many successful cosmological observations with NIST-fabricated detectors.  Shannon continues to lead millimeter-wave and far-infrared detector process development, while working toward realizing next-generation superconducting sensors for a variety of applications.


  • Superconducting sensor arrays for Cosmic Microwave Background observations 
  • Development of ultra-low noise transition edge sensors for far infrared astrophysics
  • Micro-fabrication process development for next-generation superconducting readout and detectors (e.g., NIS-TES and SQUIDs on 150 mm wafers)



Indium Bump Process for Low-Temperature Detectors and Readout

Tammy Lucas, John Biesecker, W.Bertrand (Randy) Doriese, Shannon Duff, Gene C. Hilton, Joel Ullom, Michael Vissers, Dan Schmidt
We describe our indium bump process for low-temperature detectors and associated readout. A titanium nitride under bump metallization layer (UBM) is reactively

Mitigating finite bandwidth effects in time-division- multiplexed SQUID readout of TES arrays

Malcolm Durkin, Joseph S. Adams, Simon Bandler, James A. Chervenak, Ed Denison, W.Bertrand (Randy) Doriese, Shannon Duff, Fred M. Finkbeiner, Joseph Fowler, Johnathon Gard, Gene C. Hilton, Ruslan Hummatov, Kent Irwin, Young I. Joe, Richard L. Kelley, Caroline A. Kilbourne, Antoine R. Miniussi, Kelsey Morgan, Galen O'Neil, Christine Pappas, Frederick S. Porter, Carl D. Reintsema, Kazuhiro Sakai, Stephen J. Smith, Robert W. Stevens, Daniel Swetz, Paul Szypryt, Joel Ullom, Leila R. Vale, Nicholas A. Wakeham
Time division multiplexing (TDM) is being developed as the readout technology of the X-ray integral field unit (X-IFU), a 3,168-pixel X-ray transition-edge

Demonstration of 220/280 GHz Multichroic Feedhorn-Coupled TES Polarimeter

Samantha L. Walker, Carlos E. Sierra, Jason E. Austermann, James A. Beall, Daniel T. Becker, Bradley J. Dober, Shannon M. Duff, Gene C. Hilton, Johannes Hubmayr, Jeffrey L. Van Lanen, Jeff McMahon, Sara M. Simon, Joel N. Ullom, Michael R. Vissers
We describe the design and measurement of feedhorn-coupled, transition-edge sensor (TES) polarimeters with two passbands centered at 220 GHz and 280 GHz
Created September 24, 2019, Updated October 11, 2023