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Serghei Drozdov (Fed)

Computer Scientist

Serghei Drozdov is a Computer Scientist at NIST. He received B.S. in Computer Engineering (2012) from University of Maryland and has interned at NIST's Semiconductor Metrology group (2011-2012). Serghei is currently part of the Smart Connected Manufacturing Systems group as the expert software developer and is focused on developing a discrete-event simulator for manufacturing processes.

Selected Publications

Channel Length-Dependent Series Resistance?

Author(s)
Jason P. Campbell, Kin P. Cheung, Serghei Drozdov, Richard G. Southwick, Jason T. Ryan, Tony Oates, John S. Suehle
A recently developed series resistance (RSD) extraction procedure from a single nanoscale device is shown to be highly robust. Despite these virtues, the

Physical Model for Random Telegraph Noise Amplitudes and Implications

Author(s)
Richard G. Southwick, Kin P. Cheung, Jason P. Campbell, Serghei Drozdov, Jason T. Ryan, John S. Suehle, Anthony Oates
Random Telegraph Noise (RTN) has been shown to surpass random dopant fluctuations as a cause for decananometer device variability, through the measurement of a

SERIES RESISTANCE: A MONITOR FOR HOT CARRIER STRESS

Author(s)
Jason P. Campbell, Serghei Drozdov, Kin P. Cheung, Richard G. Southwick, Jason T. Ryan, John S. Suehle, Anthony Oates
In this work, we examine a series resistance extraction technique which yields accurate values from single nano-scale devices. The series resistance values

Publications

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Created September 22, 2021, Updated July 17, 2024