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Paul D. Hale (Fed)

RF Technology Division Chief

During Dr. Hale’s career at NIST, his work has focused on providing NIST traceability that supports the microwave, high-speed electronics, and optoelectronics industries, including the development of seven NIST measurement services in those areas. Dr. Hale was also the technical co-lead on the National Advanced Spectrum and Communication Test Network (NASCTN) 3.5 GHz radar waveform measurements in 2016 and was technical lead on the NASCTN test plan development for measuring the user equipment (UE) aggregate long term evolution (LTE) emissions in the AWS-3 Band in 2017.

Dr. Hale is a Fellow of the IEEE and was an Associate Editor of Optoelectronics/ Integrated optics for the IEEE Journal of Lightwave Technology from June 2001 until March 2007. He has authored or coauthored over 100 technical publications (i10-index=68, Google Scholar, 2/19/2021)

Paul Hale (Google Scholar)

Paul Hale (


Dr, Hale has received the Department of Commerce Bronze, Silver, and Gold Awards, the Allen V. Astin Measurement Science Award, two ARFTG Best Paper Awards, and the NIST Electrical Engineering Laboratory's Outstanding Paper Award


Ultrafast waveform metrology: A first international comparison

Mark Bieler, Paul Struszewski, Ari Feldman, Jeffrey Jargon, Paul D. Hale, Pengwei Gong, Wen Xie, Chuntao Yang, Zhigang Feng, Kejia Zhao, Zhijun Yang
We report on the first international comparison in ultrafast waveform metrology. To this end, the frequency and time responses of a photodiode with a nominal

Channel Sounder Measurement Verification: Conducted Tests

Jeanne T. Quimby, Jeffrey A. Jargon, Rodney W. Leonhardt, Jake D. Rezac, Paul D. Hale, Catherine A. Remley, Amanda A. Koepke, Robert Johnk, chriss Hammerschmidt, Paul Mckenna, Irena Stange, Mike Chang
Channel modeling often provides a basis for the design and deployment of wireless technology. Engineers design systems to operate under certain expected channel
Created April 7, 2019, Updated August 4, 2021