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Paul D. Hale (Fed)

Deputy Director, CHIPS Metrology

Prior to joining CHIPS Metrology Program, Dr. Hale was Chief of the RF Technology Division. During Dr. Hale’s career at NIST, his work has focused on providing NIST traceability that supports the microwave, high-speed electronics, and optoelectronics industries, including the development of seven NIST measurement services in those areas. Dr. Hale was also the technical co-lead on the National Advanced Spectrum and Communication Test Network (NASCTN) 3.5 GHz radar waveform measurements in 2016 and was technical lead on the NASCTN test plan development for measuring the user equipment (UE) aggregate long term evolution (LTE) emissions in the AWS-3 Band in 2017.

Dr. Hale is a Fellow of the IEEE, an Ex Officio member of the International Electronics Manufacturing Initiative (iNEMI) Board of Directors, chair of the RF working group (GT-RF) of the Consultative Committee on Electromagnetics at the BIPM, and a member of the Industrial Advisory Committee for the Colorado School of Mines Electrical Engineering Department. He was an Associate Editor of Optoelectronics/ Integrated optics for the IEEE Journal of Lightwave Technology from June 2001 until March 2007. He has authored or coauthored over 110 technical publications (i10-index=72, Google Scholar, Jan. 18, 2024). 

Paul Hale (Google Scholar)


Dr, Hale has received the Department of Commerce Bronze, Silver, and Gold Awards, the Allen V. Astin Measurement Science Award, two ARFTG Best Paper Awards, and the NIST Electrical Engineering Laboratory's Outstanding Paper Award


Advancing Measurement Science for Microelectronics: CHIPS R&D Metrology Program

Marla L. Dowell, Hannah Brown, Gretchen Greene, Paul D. Hale, Brian Hoskins, Sarah Hughes, Bob R. Keller, R Joseph Kline, June W. Lau, Jeff Shainline
The CHIPS and Science Act of 2022 called for NIST to "carry out a microelectronics research program to enable advances and breakthroughs....that will accelerate

Strategic Opportunities for U.S. Semiconductor Manufacturing

Anita Balachandra, David Gundlach, Paul D. Hale, Kevin K. Jurrens, R Joseph Kline, Tim McBride, Ndubuisi George Orji, Sanjay (Jay) Rekhi, Sivaraj Shyam-Sunder, David G. Seiler
Semiconductors are critical to our Nation's economic growth, national security, and public health and safety. Revolutionary advances in microelectronics

A 110 GHz Comb Generator in a 250 nm InP HBT Technology

Jerome Cheron, Dylan Williams, Richard Chamberlin, Miguel Urteaga, Paul D. Hale, Rob Jones, Ari Feldman
We report a monolithic microwave integrated-circuit (MMIC) comb generator capable of producing a repetitive narrow pulse (7.1 ps pulse duration) with sharp
Created April 7, 2019, Updated January 30, 2024