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Paul D. Hale (Fed)

RF Technology Division Chief

During Dr. Hale’s career at NIST, his work has focused on providing NIST traceability that supports the microwave, high-speed electronics, and optoelectronics industries, including the development of seven NIST measurement services in those areas. Dr. Hale was also the technical co-lead on the National Advanced Spectrum and Communication Test Network (NASCTN) 3.5 GHz radar waveform measurements in 2016 and was technical lead on the NASCTN test plan development for measuring the user equipment (UE) aggregate long term evolution (LTE) emissions in the AWS-3 Band in 2017.

Dr. Hale is a Fellow of the IEEE and was an Associate Editor of Optoelectronics/ Integrated optics for the IEEE Journal of Lightwave Technology from June 2001 until March 2007. He has authored or coauthored over 100 technical publications (i10-index=68, Google Scholar, 2/19/2021)

Paul Hale (Google Scholar)

Paul Hale (


Dr, Hale has received the Department of Commerce Bronze, Silver, and Gold Awards, the Allen V. Astin Measurement Science Award, two ARFTG Best Paper Awards, and the NIST Electrical Engineering Laboratory's Outstanding Paper Award


Strategic Opportunities for U.S. Semiconductor Manufacturing

Anita Balachandra, David Gundlach, Paul D. Hale, Kevin K. Jurrens, R Joseph Kline, Tim McBride, Ndubuisi George Orji, Sanjay (Jay) Rekhi, Sivaraj Shyam-Sunder, David G. Seiler
Semiconductors are critical to our Nation's economic growth, national security, and public health and safety. Revolutionary advances in microelectronics

A 110 GHz Comb Generator in a 250 nm InP HBT Technology

Jerome Cheron, Dylan Williams, Richard Chamberlin, Miguel Urteaga, Paul D. Hale, Rob Jones, Ari Feldman
We report a monolithic microwave integrated-circuit (MMIC) comb generator capable of producing a repetitive narrow pulse (7.1 ps pulse duration) with sharp

Ultrafast waveform metrology: A first international comparison

Mark Bieler, Paul Struszewski, Ari Feldman, Jeffrey Jargon, Paul D. Hale, Pengwei Gong, Wen Xie, Chuntao Yang, Zhigang Feng, Kejia Zhao, Zhijun Yang
We report on the first international comparison in ultrafast waveform metrology. To this end, the frequency and time responses of a photodiode with a nominal
Created April 7, 2019, Updated December 8, 2022