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Nicholas Jungwirth (Assoc)

Publications

A fabrication-motivated model for improving characteristic impedance extraction

Author(s)
Florian Bergmann, Nicholas Jungwirth, Nicholas Derimow, Bryan Bosworth, Meagan Papac, Eric Marksz, Tomasz Karpisz, Jerome Cheron, Vincenzo St. George, Angela Stelson, Benjamin Jamroz, Christian Long, Nathan Orloff
The characteristic impedance and the propagation constant fully describe a transmission line. The multiline Thru-Reflect-Line algorithm provides a direct...

Measuring Out-of-Plane Permittivity of Thin Films to Millimeter Wave Frequencies

Author(s)
Florian Bergmann, Meagan Papac, Benjamin Jamroz, Nicholas Jungwirth, Bryan Bosworth, Anna Osella, Tomasz Karpisz, Lucas Enright, Eric Marksz, Angela Stelson, Christian Long, Nathan Orloff, Robert Jones
Modern microchips utilize multilayer stack-ups with many interstitial layers of dielectrics. Optimizing device performance and maximizing yield requires precise...
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Data and Software Publications

Created September 25, 2019, Updated December 9, 2022
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