Dr. Sohn is a physicist in the Advanced Electronics Group at the National Institute of Standards and Technology (NIST). He is leading Nanoscale Fourier Ptychographic Microscopy Project for dimensional characterization of semiconductor devices, which uses deep ultraviolet (DUV)/extreme ultraviolet (EUV) laser sources and advanced resolution enhancement techniques to obtain 3-dimensional reconstruction and phase imaging of nanostructures at the deep-subwavelength scales. The research scope includes nanoscale dimensional measurement sensitivity analysis, phase imaging for nanoscale defect detection, 3-dimensional reconstruction of nanoscale structures, angle scanning illumination, super-resolution imaging, and ptychographic image reconstruction. He is also leading Quantum Imaging Project that aims to elucidate various quantum/classical phenomena by imaging quantum states multi-dimensionally using single photons entangled and structured. The research covers nanosecond-gated single photon imaging, single photon interferences, phase analysis at single photon level, biphoton entanglement, orbital angular momentum, quantum harmonic oscillation in trapped micro/nano particles using optical tweezer and microcavities.
If you are interested in Dr. Sohn's research areas and seeking a post-doctoral position, martin.sohn [at] nist.gov (please contact Dr. Sohn) to discuss in more detail the opportunities available to join one of the projects, or visit to NRC Research Associate Programs searching the research opportunity titled "DUV/EUV Nanoscopy for Characterization of Nanoscale Devices."