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Mark D. Vaudin
Electron backscatter diffraction (EBSD) applied to microstructural, strain and texture measurements
Strain and stress determination using cross-correlation based EBSD technique for the development of nanoscale strain standards
High resolution X-ray diffraction using lattice comparator with 10-8 accuracy for lattice spacing and strain standards development
X-ray diffraction applied to texture and stress measurements using area and linear detector-based diffractometers
Scanning electron microscopy applied to broad spectrum of materials
Figures 1(left): Stress profiles measured across 350 mN wedge indentation in Si using EBSD and Confocal Raman Microscopy with different wavelength laser excitation; Figure 2(right): Lattice comparator with two x-ray sources, interferometer-controlled crystal and four test crystals