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Mark D. Vaudin (Assoc)

Research Interests

  • Electron backscatter diffraction (EBSD) applied to microstructural, strain and texture measurements
  • Strain and stress determination using cross-correlation based EBSD technique for the development of nanoscale strain standards
  • High resolution X-ray diffraction using lattice comparator with 10-8 accuracy for lattice spacing and strain standards development
  • X-ray diffraction applied to texture and stress measurements using area and linear detector-based diffractometers
  • Scanning electron microscopy applied to broad spectrum of materials


Vaudin Fig 1 and 2

Figures 1(left): Stress profiles measured across 350 mN wedge indentation in Si using EBSD and Confocal Raman Microscopy with different wavelength laser excitation; Figure 2(right): Lattice comparator with two x-ray sources, interferometer-controlled crystal and four test crystals



Microscale Mapping of Structure and Stress in Barium Titanate

Jane A. Howell, Mark D. Vaudin, Lawrence Henry Friedman, Robert F. Cook
Cross-correlation of electron backscatter diffraction (EBSD) patterns was used to generate rotation, strain, and stress maps of single-crystal tetragonal barium
Created July 30, 2019, Updated June 15, 2021