Mark D. Vaudin (Assoc)

Research Interests

• Electron backscatter diffraction (EBSD) applied to microstructural, strain and texture measurements
• Strain and stress determination using cross-correlation based EBSD technique for the development of nanoscale strain standards
• High resolution X-ray diffraction using lattice comparator with 10^-8 accuracy for lattice spacing and strain standards development
• X-ray diffraction applied to texture and stress measurements using area and linear detector-based diffractometers
• Scanning electron microscopy applied to broad spectrum of materials

Figures 1(left): Stress profiles measured across 350 mN wedge indentation in Si using EBSD and Confocal Raman Microscopy with different wavelength laser excitation; Figure 2(right): Lattice comparator with two x-ray sources, interferometer-controlled crystal and four test crystals