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Malcolm Durkin (Assoc)

Publications

Broadband high-energy resolution hard x-ray spectroscopy using transition edge sensors at SPring-8

Author(s)
Shinya Yamada, Yuto Ichinohe, Hideyuki Tatsuno, Ryota Hayakawa, Hirotaka Suda, Takaya Ohashi, Yoshitaka Ishisaki, Tomoya Uruga, Oki Sekizawa, Kiyofumi Nitta, Yoshio Takahashi, Takaaki Itai, Hiroki Suga, Makoto Nagasawa, Masato Tanaka, Minako Kurisu, Tadashi Hashimoto, Douglas Bennett, Edward V. Denison, William Doriese, Malcolm Durkin, Joseph Fowler, Galen O'Neil, Kelsey Morgan, Daniel Schmidt, Daniel Swetz, Joel Ullom, Leila R. Vale, Shinji Okada, Takuma Okumura, Toshiyuki Azuma, Toru Tamagawa, Tadaaki Isobe, Satoshi Kohjiro, Hirofumi Noda, Keigo Tanaka, Akimichi Taguchi, Yuki Imai, Kosuke Sato, Tasuku Hayashi, Teruhiko Kashiwabara, Kohei Sakata
We have succeeded in operating a transition-edge sensor (TES) spectrometer and evaluating its performance at the SPring-8 synchrotron x-ray light source. The

A Predictive Control Algorithm for Time-Division-Multiplexed Readout of TES Microcalorimeters

Author(s)
Malcolm S. Durkin, Galen C. O'Neil, William B. Doriese, Johnathon D. Gard, Gene C. Hilton, Jozsef Imrek, Nathan J. Ortiz, Carl D. Reintsema, Robert W. Stevens, Daniel S. Swetz, Joel N. Ullom
Time division multiplexing (TDM) uses a digital flux-locked loop (DFLL) to linearize each first-stage SQUID amplifier. Presently, the dynamic range of our TDM

A transition-edge sensor-based x-ray spectrometer for the study of highly charged ions at the National Institute of Standards and Technology electron beam ion trap

Author(s)
Paul Szypryt, Galen C. O'Neil, Endre Takacs, Joseph N. Tan, Sean W. Buechele, Aung Naing, Douglas A. Bennett, William B. Doriese, Malcolm S. Durkin, Joseph W. Fowler, Johnathon D. Gard, Gene C. Hilton, Kelsey M. Morgan, Carl D. Reintsema, Daniel R. Schmidt, Daniel S. Swetz, Joel N. Ullom, Yuri Ralchenko
We report on the design, commissioning, and initial measurements of a Transition-Edge Sensor (TES) x-ray spectrometer for the Electron Beam Ion Trap (EBIT) at

A TES X-ray Spectrometer for NSENSE

Author(s)
Christine G. Pappas, Malcolm S. Durkin, Joseph W. Fowler, Kelsey M. Morgan, Joel N. Ullom, William B. Doriese, Gene C. Hilton, Galen C. O'Neil, Daniel R. Schmidt, Paul Szypryt, Daniel S. Swetz
The Non-destructive Statistical Estimation of Nanoscale Structures and Electronics NSENSE instrument for IARPAs Rapid Analysis of Various Emerging
Created June 7, 2019