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Kenny Yu (IntlAssoc)

Postdoctoral Research Associate

Dr Kenny Yu is a researcher in the Materials Measurement Science Division, Material Measurement Laboratory, NIST, Gaithersburg. His research background is in thermal transport, specifically in thermoreflectance techniques, interfacial phonon transport theories, and device fabrication/process integration. He is currently involved in the Transport Property Measurements for Semiconductors and Energy Materials project.

Professional Activities

  • Active peer reviewer and poster judge for IEEE iTherm Conferences

Scholarship and Membership

  • 2025-Present: Sigma Xi - NIST Chapter, Full Member
  • 2020-2022: Irish Research Council Scholar (Enterprise Partnership Scheme - Nokia Bell Labs)
  • 2018-2020: Irish Research Council Scholar (Employment-Based Programme - Nokia Bell Labs)

Selected Publications (prior to joining NIST)

  • K. Yu, R. Enright and D. McCloskey, "Quantifying interfacial thermal conductance at solid-liquid interfaces using frequency-domain thermoreflectance and analytical methods," DOI: 10.1109/iTherm54085.2022.9899691.
  • K. Yu, R. Enright and D. McCloskey, "Monte Carlo analysis of frequency domain thermoreflectance data for quantitative measurement of interfacial thermal conductance at solid-liquid interfaces modified with self-assembled monolayers," DOI: 10.1088/1742-6596/2116/1/012042
  • S. Corbett, D. Gautam, S. Lal, K. Yu, N. Balla, G. Cunningham, K. M. Razeeb, R. Enright, and D. McCloskey, "Electrodeposited Thin-Film Micro-Thermoelectric Coolers with Extreme Heat Flux Handling and Microsecond Time Response," DOI: 10.1021/acsami.0c16614
Created August 11, 2025, Updated March 5, 2026
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