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Karen DeRocher (Fed)

Materials Research Scientist (postdoctoral research associate)

Karen DeRocher is a Postdoctoral Research Associate in the Materials Measurement Science Division at the National Institute of Standards and Technology. Karen graduated from Iowa State University with a B.S. in Materials Engineering in 2013. She obtained her Ph.D. in Materials Science and Engineering from Northwestern University in 2020. Her doctoral research involved investigating the nano-scale chemical gradients present in human enamel crystallites, and the potential effect of those gradients on the chemical and mechanical properties of the material. Karen joined NIST in 2021, and her current research focuses on the development of reliable sample preparation methods to facilitate analysis of nanoparticles using atom probe tomography.

Awards

3M Graduate Fellow (2015-2017)

Publications

Ranging Atom Probe Spectra to Reduce Measurement Bias

Author(s)
Frederick Meisenkothen, David Newton, Karen DeRocher, Mark McLean
Atom probe tomography (APT) is emerging as an essential characterization tool in a wide variety of science and engineering fields. For example, APT is helping
Created January 6, 2021, Updated December 8, 2022