Since September 2018, Dr. Joshua Taillon is a staff scientist within the Office of Data and Informatics, working in the Data Science group as a Materials Research Engineer. Drawing on his extensive background in materials characterization, his professional interests lie at the intersection of materials characterization and data science, utilizing machine learning, artificial intelligence, and state-of-the art signal/data processing techniques to facilitate greater understanding of material systems.
Prior to this appointment, Josh was an NRC Postdoctoral Associate in the Microscopy and Microanalysis Research Group (2016-2018), working with Dr. Keana Scott. During this time, his research included the development and application of novel data acquisition and processing schemes in both electron and ion-beam microscopy. More specifically, he explored the application of compressed sensing strategies to enable smarter and faster three-dimensional imaging and hyperspectral analysis within the FIB/SEM, as well as optimizing spectral unmixing techniques for fast phase mapping of EDS and EELS data.
He received a B.S. from Cornell University, and as an NSF Graduate Research Fellow, Joshua received his Ph.D. in Materials Science and Engineering from the University of Maryland under the supervision of Professor Lourdes Salamanca-Riba. While at Maryland, he specialized in analytical transmission electron microscopy and focused ion beam nanotomography, with applications in wide bandgap microelectronics and solid oxide fuel cells. In December 2016, he was presented with a Graduate Student Award from the Materials Research Society for his analytical TEM investigations of 4H-SiC MOSFET interfaces.