- 2016 - present, NRC Postdoctoral Research Associate, NIST
- Ph.D. Materials Science and Engineering, University of Maryland, 2016
- M.S. Materials Science and Engineering, University of Maryland, 2014
- B.S. Materials Science and Engineering, Cornell University, 2011
Dr. Joshua Taillon started his NRC Postdoctoral appointment in the Microscopy and Microanalysis Research Group in late 2016, working with Dr. Keana Scott. His research interests include the development and application of novel data acquisition and processing schemes in both electron and ion-beam microscopy. Most recently, he has been exploring the application of compressed sensing strategies to enable smarter and faster three-dimensional imaging and hyperspectral analysis within the FIB/SEM, under an NRC grant.
He received a B.S. from Cornell University, and as an NSF Graduate Research Fellow, Joshua received his Ph.D. in Materials Science and Engineering from the University of Maryland under the supervision of Professor Lourdes Salamanca-Riba. While at Maryland, he specialized in analytical transmission electron microscopy and focused ion beam nanotomography, with applications in wide bandgap microelectronics and solid oxide fuel cells. In December 2016, he was presented with a Graduate Student Award from the Materials Research Society for his analytical TEM investigations of 4H-SiC MOSFET interfaces.
- NRC Postdoctoral Research Fellowship, 2016 - 2018
- University of Maryland
- Materials Research Society Graduate Student Award, 2016
- NSF Graduate Research Fellowship, 2013 - 2016
- University of Maryland University Fellowship, 2011 - 2016