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Joe Bennett (Fed)

Research Chemist

Joe Bennett is a research chemist and Leader of the Surface and Trace Chemical Analysis Group in the Materials Measurement Science Division at the National Institute of Standards and Technology. He received a bachelor's degree in chemistry from Jamestown College before earning a Ph.D in Analytical Chemistry from Texas A&M University.  Joe started at NIST in 1989 as a postdoctoral researcher, becoming a staff member in 1990. His research interests focused on the application of secondary ion mass spectrometry (SIMS) to organic materials characterization and surface analysis. In 1994 Joe left NIST to join the semiconductor manufacturing consortium SEMATECH, where he applied SIMS to the qualitative and quantitative analysis of materials relevant to the semiconductor industry.  His interests included ultra-shallow dopant profiling, ultra-thin film analysis, and high spatial resolution chemical analysis. In 2008 Joe became manager of the Process Characterization Labs for SVTC, leading staff scientists and technicians in a for-profit analytical services laboratory using advanced materials analysis (AFM, Auger, SIMS, TXRF, XPS) and microscopy (FIB, SEM, TEM) techniques. In 2014 Joe returned to NIST. His current research interests include continued development of SIMS methods for analysis of both organic and inorganic materials and application of ambient ionization mass spectrometry (AI-MS) to detection of trace contraband material. Joe is active in the SIMS community and has served as a trustee for the Annual Workshop on SIMS and co-chaired the 11th International Conference on SIMS.


A Roadmap for LIMS at NIST Material Measurement Laboratory

Gretchen Greene, Jared Ragland, Zachary Trautt, June W. Lau, Raymond Plante, Joshua Taillon, Adam Abel Creuziger, Chandler A. Becker, Joe Bennett, Niksa Blonder, Lisa Borsuk, Carelyn E. Campbell, Adam Friss, Lucas Hale, Michael Halter, Robert Hanisch, Gary R. Hardin, Lyle E. Levine, Samantha Maragh, Sierra Miller, Chris Muzny, Marcus William Newrock, John Perkins, Anne L. Plant, Bruce D. Ravel, David J. Ross, John Henry J. Scott, Christopher Szakal, Alessandro Tona, Peter Vallone
Instrumentation generates data faster and in higher quantity than ever before, and interlaboratory research is in historic demand domestically and

Combining secondary ion mass spectrometry image depth profiling and single particle inductively coupled plasma mass spectrometry to investigate the uptake and biodistribution of gold nanoparticles in Caenorhabditis elegans

Monique Johnson, Joe Bennett, Antonio Montoro Bustos, Shannon Hanna, Andrei Kolmakov, Nicholas Sharp, Elijah Petersen, Christopher Sims, Bryant C. Nelson, Patricia Lapasset
Analytical techniques capable of determining the spatial distribution and quantity (mass and/or particle number) of engineered nanomaterials in organisms are

A Standards and Measurement Infrastructure for Calibration, Verification and Optimization of Trace Explosives Detection Systems

John G. Gillen, Jennifer R. Verkouteren, R M. Verkouteren, Marcela N. Najarro, Edward R. Sisco, Matthew E. Staymates, Jessica L. Staymates, Robert A. Fletcher, Jeffrey A. Lawrence, Elizabeth L. Robinson, Alexander T. Bulk, Joseph A. Bennett, Shinichiro Muramoto, Thomas P. Forbes
Current national priorities in homeland security have led to an unprecedented level of utilization of explosives trace detection (ETD) systems for
Created August 15, 2019, Updated April 5, 2023