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Jeff Van Lanen

Publications

Photon-noise limited sensitivity in titanium nitride kinetic inductance detectors

Author(s)
Johannes Hubmayr, James A. Beall, Daniel T. Becker, Hsiao-Mei Cho, Gene C. Hilton, Dale Li, David P. Pappas, Jeffrey L. Van Lanen, Mark Devlin, Kent D. Irwin, Chris Groppi, Phillip Mauskopf
We demonstrate photon-noise limited performance at sub-millimeter wavelengths in microwave kinetic inductance detectors (MKIDs) made of a new superconducting

Improvements in silicon oxide dielectric loss for superconducting microwave detector circuits

Author(s)
Dale Li, Jason Austermann, James A. Beall, Daniel T. Becker, Hsiao-Mei Cho, Anna E. Fox, Nils Halverson, Jason Henning, Gene C. Hilton, Johannes Hubmayr, Jeffrey L. Van Lanen, John P. Nibarger, Michael D. Niemack, Kent D. Irwin
Dielectric loss in low-temperature superconducting integrated circuits can cause lower overall efficiency, particularly in the 90 to 220 GHz regime. We present

An 84 Pixel All-Silicon Corrugated Feedhorn for CMB Measurements

Author(s)
John P. Nibarger, James A. Beall, Daniel T. Becker, Joseph W. Britton, Hsiao-Mei Cho, Anna E. Fox, Gene C. Hilton, Johannes Hubmayr, Dale Li, Kent D. Irwin, Jeffrey L. Van Lanen, Jeff McMahon, Ki Won Yoon
Silicon platelet corrugated feedhorn for cosmic microwave background (CMB) measurements in the mm wave (130 to 170 GHz) have been developed for deployment for
Created April 14, 2019