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Jason J. Gorman (Fed)
Division Chief
Jason J. Gorman is the Division Chief for the Microsystems and Nanotechnology Division within the Physical Measurement Laboratory at NIST. He received a B.S. in Aerospace Engineering from Boston University, and an M.S. and Ph.D. in Mechanical Engineering from The Pennsylvania State University, where he was supported by a National Science Foundation Graduate Research Traineeship. Jason joined NIST as a staff member after completing a National Research Council Postdoctoral Associateship. Before becoming Division Chief, he was the Group Leader for the Photonics and Optomechanics Group from 2022 to 2025. His research focuses on micro- and nanomechanical resonators, microwave acoustic devices, cavity optomechanics, and integrated nanophotonics, and their application to accurate sensing, frequency control, and quantum information science.
Selected Publications
Feedback Control of MEMS to Atoms, J.J. Gorman and B. Shapiro, Eds., New York: Springer, 2012.
Optical knife-edge displacement measurement with sub-picometer resolution for RF-MEMS, V.J. Gokhale and J.J. Gorman, J. Microelectromech. Sys., 27, pp. 910–920, 2018.
Effect of pulse asymmetry and nonlinear chirp on the accuracy of ultrafast pulsed laser interferometry, L. Shao, J.R. Lawall, and J.J. Gorman, Opt. Lett., 42, pp. 5125–5128, 2017.
Concave silicon micromirrors for stable hemispherical optical microcavities, Y. Bao, F. Zhou, T.W. Lebrun, and J.J. Gorman, Opt. Express, 25, pp. 15493–15503, 2017.
Approaching the intrinsic quality factor limit for micromechanical bulk acoustic resonators using phononic crystal tethers, V.J. Gokhale and J.J. Gorman, Appl. Phys. Lett., 111, 013501, 2017.
Growth of monolayer graphene on nanoscale copper-nickel alloy thin films, J.H. Cho, J.J. Gorman, S.R. Na and M. Cullinan, Carbon, 115, pp. 441–448, 2017.
Mode selection for electrostatic beam resonators based on motional resistance and quality factor, J.H. Ryou and J.J. Gorman, J. Appl. Phys., 120, 214501, 2016.
Pulsed laser interferometry with sub-picometer resolution using quadrature detection, L. Shao and J.J. Gorman, Opt. Express, 24, pp. 17459–17469, 2016.