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Galen O'Neil (Fed)

Galen O’Neil is a research physicist in the Quantum Sensors at NIST. He develops high-resolution and high-efficiency single photon sensors using superconducting devices at or below 100 mK, and pioneers new applications with these sensors. He is currently leading the effort to create the most powerful soft x-ray spectrometer for carbon chemistry ever conceived, with the goal of improving our knowledge of carbon catalysis to combat global warming. He has received a Department of Commerce Gold Medal and a Silver Medal.

Research Projects & Interests

Publications

A tabletop x-ray tomography instrument for nanometer-scale imaging: demonstration of the 1,000-element transition-edge sensor subarray

Author(s)
Paul Szypryt, Nathan J. Nakamura, Dan Becker, Douglas Bennett, Amber L. Dagel, W.Bertrand (Randy) Doriese, Joseph Fowler, Johnathon Gard, J. Zachariah Harris, Gene C. Hilton, Jozsef Imrek, Edward S. Jimenez, Kurt W. Larson, Zachary H. Levine, John Mates, Daniel McArthur, Luis Miaja Avila, Kelsey Morgan, Galen O'Neil, Nathan Ortiz, Christine G. Pappas, Dan Schmidt, Kyle R. Thompson, Joel Ullom, Leila R. Vale, Michael Vissers, Christopher Walker, Joel Weber, Abigail Wessels, Jason W. Wheeler, Daniel Swetz
We report on the 1,000-element transition-edge sensor (TES) x-ray spectrometer implementation of the TOMographic Circuit Analysis Tool (TOMCAT). TOMCAT combines

Proof-of-Principle Experiment for Testing Strong-Field Quantum Electrodynamics with Exotic Atoms: High Precision X-Ray Spectroscopy of Muonic Neon

Author(s)
Douglas Bennett, W.Bertrand (Randy) Doriese, Malcolm Durkin, Joseph Fowler, Johnathon Gard, Gene C. Hilton, Kelsey Morgan, Galen O'Neil, Carl D. Reintsema, Dan Schmidt, Daniel Swetz, Joel Ullom, Takuma Okumura
To test the bound-state quantum electrodynamics (BSQED), we have performed high precision x- ray spectroscopy of the 5g→4f and 5f→4d transitions (BSQED

Background and blended spectral line reduction in precision spectroscopy of EUV and x-ray transitions in highly charged ions

Author(s)
Yuri Ralchenko, Joseph N. Tan, Aung S. Naing, Galen O'Neil, Paul Szypryt, Dipti Dipti, Grant Mondeel, Roshani Silwal, Alain Lapierre, Steven Blundell, Gerald Gwinner, Antonio Camargo Villari, Endre Takacs
We report a method in EBIT spectral analysis that reduces signal from contaminant lines of 1 known or unknown origin. We utilize similar ion charge

Patents (2018-Present)

X-Ray Spectrometer

X-Ray Spectrometer

NIST Inventors
Kevin L. Silverman , Carl D. Reintsema , Galen O'Neil , Luis Miaja Avila , Daniel Swetz , W.Bertrand (Randy) Doriese , Dan Schmidt , Bradley Alpert , Joseph Fowler , Joel Ullom , Ralph Jimenez and Gene C. Hilton
This invention includes: an x-ray plasma source that produces primary x-rays; an x-ray optic that transmits and focuses the primary x-ray onto a sample jet from which fluorescence x-ray are emitted; and a microcalorimeter array detector that measures the energy of the incoming fluorescence x-rays
Created May 22, 2018, Updated October 11, 2023