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Eric S. Stanfield

Sr. Dimensional Metrologist

Mr. Stanfield is a dimensional metrologist and mechanical engineer in the Dimensional Metrology Group in the Sensor Science Division of the Physical Measurement Laboratory (PML) at the National Institute of Standards and Technology (NIST).

In his current position, he is responsible for the realization and dissemination of the SI unit of length through the provision of measurement services to U.S. industry, academia, and other government agencies. His expertise includes advanced mechanical and interferometric dimensional measurement, self-calibrating techniques, coordinate metrology, uncertainty determination, and ISO/IEC 17025 quality system requirements. He actively manages and leads measurement science research efforts to improve the accuracy and efficiency of current services and the development of new methods to address measurement needs in support of advanced manufacturing.

Awards

  • 2019 - Dimensional Metrology Group’s Above and Beyond Award
  • 2017  - Butler County Community College (Butler, PA) 2017 Distinguished Alumni https://www.bc3.edu/about/who-we-are/alumni/awards.html
  • 2004 - The Judson C. French Award for Outstanding Leadership in the Development of Improved Dimensional Calibration Services with Higher Efficiency, Accuracy, and Customer Satisfaction
  • 2004 - Benjamin C. Cruikshanks Award for Highest Academic Standing in Mechanical and Aerospace Engineering Program, George Washington University
  • 1996 - Engineering/Physics Achievement Award, Montgomery County Community College, Germantown, MD
  • 1995/1996 - Outstanding Student in Mechanical Engineering, Montgomery County Community College, Germantown, MD

Publications

Sphere Diameter Interferometry with Nanometer Uncertainty

Author(s)
Eric S. Stanfield, John R. Stoup, Michael P. Braine, Theodore D. Doiron
In this paper we present both the design details and uncertainty budget for a National Institute of Standards and Technology (NIST)-developed high-accuracy
Created October 9, 2019, Updated August 19, 2020