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Angela Stelson (Fed)

I develop new microwave measurement techniques for coaxial, waveguide and on-wafer applications. The measurement techniques I develop have applications in fundamental communications technology and support NIST’s traceability in microwave impedance. Additionally, through work in the NIST-on-a-Chip project, I am developing new microwave microfluidic measurements that have applications in medical diagnostics, catalysts and pharmaceuticals.

Professional Awards and Recognition

  • DOC Bronze Medal, 2020
  • NIST NRC Fellowship, 2017-2019
  • NSF Grassroots GK12 Fellow, 2013
  • Lester B, Knight Nanotechnology Fellow, 2012

Publications

See Google Scholar for recent publications.

Publications

Characterizing interconnects to 325 GHz

Author(s)
Nicholas Jungwirth, Bryan Bosworth, Meagan Papac, Aaron Hagerstrom, Eric Marksz, Jerome Cheron, Angela Stelson, Florian Bergmann, Ari Feldman, Dylan Williams, Christian Long, Nathan Orloff
We developed an interconnect characterization procedure that first embeds the interconnect into the error boxes of a multiline thru-reflect-line calibration and

Broadband Characterization of Flexible Conductor-Dielectric Composites

Author(s)
Luckshitha Suriyasena Liyanage, Nathan Orloff, Nicholas Jungwirth, Sarah Evans, Christian Long, Angela Stelson, Jacob Pawlik, James Booth
Broadband measurements are important for characterizing a wide range of materials for communications applications at microwave and mm-wave frequencies. Here we

NMR Spectroscopy and Multiscale Modeling Shed Light on Ion–Solvent Interactions and Ion Pairing in Aqueous NaF Solutions

Author(s)
Gosia Musial, Demian Riccardi, Chris Suiter, Ethan Sontarp, Samantha Miller, Robert Lirette, Kyle Covington-Rehmeier, Avik Mahata, Chris Muzny, Angela Stelson, Kathleen Schwarz, Jason A. Widegren
The balance between ion solvation and ion pairing in aqueous solutions modulates chemical and physical processes from catalysis to protein folding. Yet, despite

Traceable RF Power Metering Procedures With Thermoelectric Sensors

Author(s)
Zenn Roberts, Aaron Hagerstrom, Cole Gray, Angela Stelson, Vincent Neylon, Christian Long
The National Institute of Standards and Technology (NIST) maintains the United State's primary standards for traceable RF and mm-wave power measurements. These

Demonstrating Broadside-Coupled Coplanar Waveguide Interconnects to 325 GHz

Author(s)
Nicholas Jungwirth, Bryan Bosworth, Aaron Hagerstrom, Meagan Papac, Eric Marksz, JEROME CHERON, Kassiopeia Smith, Angela Stelson, Ari Feldman, Dylan Williams, Nathan Orloff, Christian Long
State-of-the-art integrated circuits leverage dissimilar materials to optimize system performance. Such heterogeneous integration often involves multiple chips
View more Publications
Created December 8, 2019, Updated December 8, 2022