Aaron Hagerstrom

Publications

Physical Models and Dimensional Traceability of 2.4 mm Coaxial Airline Standards for Determining Systematic Uncertainties of Calibrated Scattering-Parameters

July 6, 2023

Author(s)

Jeffrey Jargon, Dylan Williams, Angela Stelson, Chris Long, Aaron Hagerstrom, John R. Stoup, Eric S. Stanfield

In this report, we document the models and dimensional traceability of our 2.4 mm coaxial airline standards for performing multiline thru-reflect-line

Modeling the linear and nonlinear dielectric response of solvents

March 13, 2023

Author(s)

Michael Woodcox, Avik Mahata, Aaron Hagerstrom, Angela Stelson, Chris Muzny, Ravishankar Sundararaman, Kathleen Schwarz

We demonstrate a method to compute the dielectric spectra of fluids in molecular dynamics by directly applying electric fields to the simulation. We obtain

Quantifying Noise Floor and Trace Noise in VNA Measurements for the WR-15 Waveguide Band

August 1, 2022

Author(s)

Aaron Hagerstrom, Angela Stelson, Jeffrey Jargon, Chris Long

We present a model and measured data to assess the uncertainties in scattering-parameter measurements due to noise floor and trace noise in the receivers of a

Quantifying Receiver Nonlinearities in VNA Measurements for the WR-15 Waveguide Band

March 15, 2022

Author(s)

Angela Stelson, Aaron Hagerstrom, Jeffrey Jargon, Chris Long

Scattering (S-) parameters are fundamental to numerous microwave quantities including antenna factors, microwave power, and phase. The uncertainty in S

Updates to the traceability of mm-wave power measurements at NIST

December 17, 2021

Author(s)

Aaron Hagerstrom, Angela Stelson, Jeffrey Jargon, Chris Long

Metrological traceability helps ensure the reliability of measurements by allowing them to be compared with established international standards with well

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Aaron Hagerstrom (Fed)

Publications