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Patents

Searches Patent Title, Abstract, Body, Technology Type, and NIST Inventors
Displaying 1 - 3 of 3
Patent description for Critical-Dimension Localization Microscopy

Apparatus for Critical-Dimension Localization Microscopy

NIST Inventors
Samuel M. Stavis and Craig Copeland
Performing critical-dimension localization microscopy includes: subjecting a first dimensional member and a second dimensional member of a reference artifact to critical-dimension metrology, the first and second dimensional members, in combination, including a critical dimension and each
Patent Images and description for 10,955,617

High-Resolution Photonic Thermometer Article

NIST Inventors
Kevin O Douglass , Zeeshan Ahmed and Nikolai Klimov
A high-resolution photonic thermometer article performs high-resolution thermometry and includes: a light source; a photonic thermometer with a waveguide and a photonic crystal cavity that stores light; a photodetector in communication with the photonic thermometer; a phase sensitive detector in
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