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Search Patents by Benjamin Caplins

Patents listed here reflect only technologies patented from FY 2018-present. To view all of NIST's patented technologies, visit the NIST pages on the Federal Laboratory Consortium website.

Displaying 1 - 1 of 1

Dynamic Multi-Wavelength and Sample Voltage Atom Probe Tomograph Feedback Control System

NIST Inventors
Ann Chiaramonti Debay , Norman A. Sanford , Luis Miaja Avila and Benjamin Caplins
This invention is a high-precision atomic-scale analysis system designed to map the atomic-scale chemical structure of materials with improved accuracy and precision. By integrating a multi-wavelength pulsed radiation source with a high-voltage power supply, the system identifies and locates
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