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Search Patents by Randall P Wagner

Patents listed here reflect only technologies patented from FY 2018-present. To view all of NIST's patented technologies, visit the NIST pages on the Federal Laboratory Consortium website.

Displaying 1 - 2 of 2

Sound Pressure Metrology Instrument And Determining Sound Pressure From Index Of Refraction

NIST Inventors
Richard A. Allen , Randall P Wagner , Benjamin Reschovsky and Akobuije Chijioke
A sound pressure metrology instrument determines sound pressure from index of refraction and includes: a light source that produces source light; the optical cavity that: receives an acoustic field from the sound source; receives the source light from the light source; produces acoustic-modified
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