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PUBLICATIONS

Reliability of Nano-Electronic Devices

Published

Author(s)

Anthony S. Oates, Kin P. Cheung

Abstract

This is a general overview of reliability challenge of advanced CMOS
Citation
CHALLENGES IN NANOELECTRONICS
Publisher Info
Wiley, Hoboken, NJ
Pub Type
Book Chapters

Keywords

CMOS, reliability, front end, back end, scaling
Nanoelectronics

Citation

Oates, A. and Cheung, K. (2017), Reliability of Nano-Electronic Devices, CHALLENGES IN NANOELECTRONICS, Wiley, Hoboken, NJ (Accessed October 10, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created May 31, 2017, Updated October 12, 2021
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