Williams, D.
(2014),
A Prescription for THz Transistor Characterization, NIST Website/Electromagnetics Division/High-Speed Electronics, [online], https://doi.org/10.1109/INMMIC.2014.6815113, http://www.nist.gov/pml/electromagnetics/rf_electronics/dylan.cfm
(Accessed October 10, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
A Prescription for THz Transistor Characterization
Published
Author(s)
Abstract
Advances in microwave wafer probes and vector network analyzers have opened up a whole new world of discovery in microwave metrology, making possible accurate on-wafer measurements in printed transmission lines at microwave, millimeter-wave, sub-millimeter-wave, and even terahertz frequencies. Dr. Dylan Williams, winner of the 2013 IEEE Joseph F. Keithley Award in Instrumentation and Measurement, will trace the history of on-wafer measurements, discuss the fundamental principles behind on-wafer measurements and tell you everything you need to know about how to make accurate on-wafer measurements from DC to THz frequencies.Citation
NIST Website/Electromagnetics Division/High-Speed Electronics
Pub Type
Websites
Download Paper
Keywords
microwave measurement, on-wafer measurement, transistor
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created April 4, 2014, Updated January 27, 2020