Dyer, S.
, Dennis, T.
, Williams, P.
, Roberson, L.
, Etzel, S.
, Espejo, R.
, Germer, T.
and Milner, T.
(2006),
High Sensitivity Measurements of the Scattering Dispersion of Phantoms using Spectral Domain Optical Coherence Tomography, SPIE Coherence Domain Optical Methods and Optical Coherence Tomography in Biomedicine X, San Jose, CA, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32051
(Accessed October 8, 2025)
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High Sensitivity Measurements of the Scattering Dispersion of Phantoms using Spectral Domain Optical Coherence Tomography
Published
Author(s)
, , , , , , , T E. Milner
Abstract
We demonstrate a novel technique to determine the size of Mie scatterers with high sensitivity. Our technique is based on spectral domain optical coherence tomography measurements of the dispersion that is induced by the scattering process. We use both Mie scattering theory and dispersion measurements of phantoms to show that the scattering dispersion is very sensitive to small changes in the size and/or refractive index of the scatterer.Volume
6079
Issue
60791Q
Conference Dates
January 21-26, 2006
Conference Location
San Jose, CA, USA
Conference Title
SPIE Coherence Domain Optical Methods and Optical Coherence Tomography in Biomedicine X
Pub Type
Conferences
Download Paper
Keywords
cancer, dispersion, Mie scattering, optical coherence tomography, spectral domain
Citation
Issues
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Created January 25, 2006, Updated October 12, 2021