NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.
Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.
An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Accurate clock synchronization and time stamping plays a significant role in ensuring data quality as the semiconductor industry faces an imminent data explosion with the deployment of Interface A. Standards and Guidelines significantly ease the deployment of factory-wide distributed system synchronization where many pieces of equipment and applications from a variety of vendors exist. The SEMI Time Synchronization Working Group identified the industry?s critical timing requirements and addressed the challenges by developing new standards and guidelines while ensuring legacy standards can adopt the new standard and maintain backwards compatibility. This presentation provides insight to the motivations and key concepts for a time synchronization standard and reports on experiences doing evaluations of Interface A implementations. These experiences highlight additional insights possible with Interface A, including the internal sensor data value refresh rate. Interface A provides finer data collection granularity, more visibility into the data, and a window into the industry?s data quality issues.
advanced process control, data quality, time synchronization, time-stamping
Citation
Wohlwend, H.
, Crispieri, G.
and Li-Baboud, Y.
(2006),
Advancing Factory-Wide Data Quality for APC Applications, AEC/APC Symposium-Asia, Taipei, 1, TW, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=32533
(Accessed October 13, 2025)