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PUBLICATIONS

A Measurement Method for Determining the Optical and Electro-Optical Properties of a Thin Film

Published

Author(s)

Donald R. Larson
Citation
NIST Interagency/Internal Report (NISTIR) - 81-1652
Report Number
81-1652
Issue
23
NIST Pub Series
NIST Interagency/Internal Report (NISTIR)
Pub Type
NIST Pubs

Citation

Larson, D. (1981), A Measurement Method for Determining the Optical and Electro-Optical Properties of a Thin Film, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD (Accessed November 7, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created December 1, 1981, Updated January 27, 2020
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