Witczak, S.
, Suehle, J.
and Gaitan, M.
(1992),
An Experimental Comparison of Measurement Techniques to Extract Si-SiO<sub>2</sub> Interface Trap Density, Solid-State Electronics
(Accessed October 11, 2025)
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An Experimental Comparison of Measurement Techniques to Extract Si-SiO2 Interface Trap Density
Published
Author(s)
S C. Witczak, ,
Citation
Solid-State Electronics
Volume
35
Issue
3
Pub Type
Journals
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created December 30, 1992, Updated October 12, 2021