TY  - JOUR
AU  - S Witczak
AU  - John Suehle
AU  - Michael Gaitan
C2  - Solid-State Electronics
DA  - 1992-12-31 00:12:00
LA  - en
M1  - 35
PB  - Solid-State Electronics
PY  - 1992
TI  - An Experimental Comparison of Measurement Techniques to Extract Si-SiO<sub>2</sub> Interface Trap Density
ER  -