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PUBLICATIONS

The Effects of Localized Hot-Carrier-Induced Charge in VLSI Switching Circuits

Published

Author(s)

John S. Suehle, Kathleen Gallo
Proceedings Title
Proc., 17th Yugoslav Conference on Microelectronics
Conference Dates
May 9-11, 1989
Conference Location
Nish, 1, YU
Pub Type
Conferences

Citation

Suehle, J. and Gallo, K. (1989), The Effects of Localized Hot-Carrier-Induced Charge in VLSI Switching Circuits, Proc., 17th Yugoslav Conference on Microelectronics, Nish, 1, YU (Accessed October 25, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created December 30, 1989, Updated October 12, 2021
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