NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.
Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.
An official website of the United States government
Here’s how you know
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
RII Spectroscopy of Trap Levels in Bulk and LPE Hg1-xCdxTe
Published
Author(s)
Chris L. Littler, X. N. Song, Z. Yu, J. L. Elkind, J R. Lowney, David G. Seiler
Citation
Semiconductor Science and Technology
Volume
8
Pub Type
Journals
Citation
Littler, C.
, Song, X.
, Yu, Z.
, Elkind, J.
, Lowney, J.
and Seiler, D.
(1993),
RII Spectroscopy of Trap Levels in Bulk and LPE Hg<sub>1-x</sub>CdxTe, Semiconductor Science and Technology
(Accessed November 6, 2025)