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PUBLICATIONS

Assessment of Reliability Concerns for Wide-Temperature Operation of Semiconductor Devices and Circuits

Published

Author(s)

Joseph Kopanski, David L. Blackburn, George G. Harman, David W. Berning
Proceedings Title
Proc., First International High Temperature Electronics Conference
Conference Dates
June 16-20, 1991
Conference Location
Albuquerque, NM, USA
Pub Type
Conferences

Citation

Kopanski, J. , Blackburn, D. , Harman, G. and Berning, D. (1991), Assessment of Reliability Concerns for Wide-Temperature Operation of Semiconductor Devices and Circuits, Proc., First International High Temperature Electronics Conference, Albuquerque, NM, USA (Accessed October 18, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created December 30, 1991, Updated October 12, 2021
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